Materials Map

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (2/2 displayed)

  • 2021Restored strange metal phase through suppression of charge density waves in underdoped YBCO35citations
  • 2012A stochastic analysis of cross-hole ground-penetrating rada zero-offset profiles for subsurface characterization7citations

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Chart of shared publication
Fumagalli, Roberto
1 / 1 shared
Brookes, N. B.
1 / 10 shared
Bauch, Thilo
1 / 8 shared
Wahlberg, Eric
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Lombardi, Floriana
1 / 9 shared
Caprara, Sergio
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Gran, Ulf
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Ghiringhelli, Giacomo
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Braicovich, Lucio
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Trabaldo, Edoardo
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Arpaia, Riccardo
1 / 4 shared
Cassiani, Giorgio
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Binley, Andrew
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2021
2012

Co-Authors (by relevance)

  • Fumagalli, Roberto
  • Brookes, N. B.
  • Bauch, Thilo
  • Wahlberg, Eric
  • Lombardi, Floriana
  • Caprara, Sergio
  • Gran, Ulf
  • Ghiringhelli, Giacomo
  • Braicovich, Lucio
  • Trabaldo, Edoardo
  • Arpaia, Riccardo
  • Cassiani, Giorgio
  • Binley, Andrew
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article

A stochastic analysis of cross-hole ground-penetrating rada zero-offset profiles for subsurface characterization

  • Cassiani, Giorgio
  • Binley, Andrew
  • Rossi, Matteo
Abstract

<p>Cross-hole ground-penetrating radar (GPR) zero-offset profiling (ZOP) is a well-established technique for the measurement of the one-dimensional (1-D) vertical distribution of soil dielectric permittivity and has often been used in time-lapse mode for the monitoring of natural or man-made infiltration and soil moisture redistribution processes in the vadose zone. However, in spite of its widespread use, the quantitative interpretation of ZOPs in terms of dielectric permittivity profiles is known to be fraught with difficulties. Often a simplified approach is adopted that translates directly ZOP travel times into electromagnetic (EM) velocities and these, in turn, into dielectric permittivities and soil volumetric moisture content. This approach is known to lead to over-smoothed moisture content profiles, which are a consequence of the ZOP measurement scale, controlled by critical refractions along fast layers and averaging effects within the first Fresnel zone. Such smooth profiles are not necessarily compatible with the true soil moisture content that should be reproduced by water flow models. In this paper we present a stochastic inversion approach that aims at solving these issues. The approach is based on a forward stochastic simulation that generates the expected travel times by means of a two-dimensional (2-D) full waveform modeling, thus reproducing all physical processes that contribute to profile smoothing. We first assess the robustness of this approach on synthetic data, where the true dielectric permittivity profile is known. Then we apply the technique to two different case studies, where the results of the proposed technique show supporting evidence from independent information on the sites' stratigraphy. The proposed approach proves to be capable of reconstructing sharp dielectric profiles, in addition to assigning relevant uncertainty bounds derived from the expected errors in travel time picking. These results may prove very useful in a correct assessment of the hydrological implications of the measured dielectric permittivity, and thus moisture content, profile.</p>

Topics
  • impedance spectroscopy
  • simulation
  • two-dimensional
  • one-dimensional