| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Zhou, Zhaoxia
Loughborough University
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (4/4 displayed)
- 2024Measuring coefficient of thermal expansion of materials of micrometre size using SEM/FIB microscope with in situ MEMS heating stagecitations
- 2023Amorphous-crystalline nanostructured Nd-Fe-B permanent magnets using laser powder bed fusion: metallurgy and magnetic propertiescitations
- 2023Evolution and formation of dissimilar metal interface s in fusion weldingcitations
- 2016Demonstration of polycrystalline thin film coatings on glass for spin Seebeck energy harvesting - dataset
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document
Demonstration of polycrystalline thin film coatings on glass for spin Seebeck energy harvesting - dataset
Abstract
Zip file with all raw XRD, XRR, transport data.Origin project(s) containing raw and processed data for related publication.<br>Figure 1 was schematic only and not included here.Figure 2 and Figure S2 are in the same origin project (simple and extended TEM data).<br>Figure captions:Figure 2 TEM analysis of SSE5a. a) & b) STEM/BF and HAADF images of the thin film, respectively. c) Conventional HREM of the PM Pt layer. d) EDX line-scan performed perpendicular to the interfaces of the layers.Figure 3 Summary of the magnetic, electric and thermal properties. a) Spin Seebeck voltage, <i>V<sub>ISHE</sub></i> (symbols), as a function of applied magnetic field plotted alongside magnetic data (line). b) Resistivity of the devices as a function of <i>t<sub>PM</sub></i>. c) Normalised spin Seebeck voltage, <i>S<sub>SSE</sub></i>, as a function of <i>t<sub>PM</sub></i>, plotted alongside simulated <i>S<sub>SSE</sub></i> (<i>θ<sub>SH</sub></i> = 0.1, <i>λ<sub>SD</sub></i> = 2 nm, <i>M<sub>s</sub></i> = 90 Am<sup>2</sup>/kg, D = 71x10<sup>41</sup> Jm<sup>2</sup>[19], <i>g<sub>r</sub></i> = 1,3 & 5x10<sup>18</sup> m<sup>-2</sup>[20]). d) Definition of the parameters used to describe heat flow, (e) & (f) Change in <i>ΔT<sub>2</sub></i>, and <i>S<sub>SSE</sub></i> with substrate's thermal conductivity, <i>κ<sub>3</sub></i>.Figure S1 Characterisation of the Fe<sub>3</sub>O<sub>4</sub> film. a) SQUID magnetometry above and below the Verwey transition, <i>T<sub>V</sub></i>. b) Resistivity as a function of temperature. c) XRD of a set of 4 separately prepared Fe<sub>3</sub>O<sub>4</sub> films. The inset shows a close-up of the (311), (222) peaks. d) Example XRR data (symbols) and fit (solid line), indicating thickness = 79 nm, roughness = 1.5 nm.Figure S2 TEM analysis of SSE5a. a) & b) STEM/BF and HAADF images of the thin film, respectively. c) Conventional HREM of the PM Pt layer. d) & e) STEM/BF image of the thin film stack and corresponding EDX line-scan performed perpendicular to the interfaces of the layers, respectively, and f) schematic of the grain growth described in the text.Figure S3 Characteristics of the bilayer film. a) XRD of SSE5a (2.5 nm Pt) and SSE20a (7.3 nm Pt). Inset shows a close-up of the Pt peak. b) XRR fit of SSE5a; Pt thickness = 2.5 nm, roughness = 2 nm.Figure S4 Example spin Seebeck measurement for SSE7a (<i>t<sub>PM</sub></i> = 3.2 nm) measured in fixed field as a function of temperature difference. Note that the sign...