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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Kaneko, K.
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Topics
Publications (7/7 displayed)
- 2013Core-shell catalysts consisting of nanoporous cores for oxygen reduction reactioncitations
- 20123-dimensional imaging of dislocation microstructures by electron beams
- 2012Influence of relative humidity on fracture toughness of rock: Implications for subcritical crack growth
- 2012Influence of relative humidity on fracture toughness of rock: implications for subcritical crack growthcitations
- 2011High-angle triple-axis specimen holder for three-dimensional diffraction contrast imaging in transmission electron microscopycitations
- 2010Pt monolayer on porous Pd-Cu alloys as oxygen reduction electrocatalystscitations
- 2006Microstructure analyses of metal-filled carbon nanotubes synthesized by microwave plasma-enhanced chemical vapor depositioncitations
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document
3-dimensional imaging of dislocation microstructures by electron beams
Abstract
<p>We review the progress in the electron tomography of dislocation microstructures in the transmission electron microscope (TEM). Dislocation contrast is visible both in conventional TEM and scanning TEM (STEM) modes and, despite the complicated intensity variations, dislocation contrast can be isolated using computational filtering techniques prior to reconstruction. We find that STEM annular dark-field (STEM-ADF) imaging offers significant advantages in terms of dislocation contrast and background artifacts. We present several examples, both in semiconducting and metallic systems, illustrating the properties of 3D dislocations. We present the high-angle triple-axis (HATA) specimen holder where the diffraction condition can be chosen at will and dislocation tomograms of multiple reflections can be combined. 3D dislocations are analyzed in terms of dislocation density and dislocation nodal structures. Several avenues of study are suggested that may exploit the 3D dislocation data.</p>