Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (6/6 displayed)

  • 2012Metallization of a Genetically Engineered Polypeptide2citations
  • 2007Properties of ultrathin platinum deposited by atomic layer deposition for nanoscale copper-metallization schemes34citations
  • 2005Spectroellipsometric characterization of Au-Y<sub>2</sub>O<sub>3</sub>–stabilized ZrO<sub>2</sub> nanocomposite films23citations
  • 2004Atomic layer deposition of tantalum nitride for ultrathin liner applications in advanced copper metallization schemes42citations
  • 2004Chemical Vapor Deposition of ZnS:Mn for Thin-Film Electroluminescent Display Applications17citations
  • 2001MOCVD ZnS:Mn Films: Crystal Structure and Defect Microstructure as a Function of the Growth Parameterscitations

Places of action

Chart of shared publication
Topilina, Natasha I.
1 / 1 shared
Eisenbraun, Eric T.
2 / 2 shared
Welch, John T.
1 / 1 shared
Geer, Robert E.
2 / 2 shared
Carlsen, Autumn
1 / 1 shared
Higashiya, Seiichiro
1 / 1 shared
Zhu, Yu
2 / 6 shared
Carpenter, Michael A.
1 / 23 shared
Efstathiadis, Harry
1 / 2 shared
Sirinakis, George
1 / 1 shared
Siddique, Rezina
1 / 1 shared
Sun, Lianchao
1 / 1 shared
Straten, Oscar Van Der
1 / 3 shared
Topol, Anna W.
2 / 2 shared
Nuesca, Guillermo M.
1 / 1 shared
Barth, Karl W.
1 / 1 shared
Dovidenko, Katharine
2 / 2 shared
Taylor, Brian K.
1 / 1 shared
Tuenge, Richard T.
1 / 1 shared
King, Chris N.
1 / 1 shared
Shekhawat, Gajendra S.
1 / 1 shared
Chart of publication period
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Co-Authors (by relevance)

  • Topilina, Natasha I.
  • Eisenbraun, Eric T.
  • Welch, John T.
  • Geer, Robert E.
  • Carlsen, Autumn
  • Higashiya, Seiichiro
  • Zhu, Yu
  • Carpenter, Michael A.
  • Efstathiadis, Harry
  • Sirinakis, George
  • Siddique, Rezina
  • Sun, Lianchao
  • Straten, Oscar Van Der
  • Topol, Anna W.
  • Nuesca, Guillermo M.
  • Barth, Karl W.
  • Dovidenko, Katharine
  • Taylor, Brian K.
  • Tuenge, Richard T.
  • King, Chris N.
  • Shekhawat, Gajendra S.
OrganizationsLocationPeople

article

Spectroellipsometric characterization of Au-Y<sub>2</sub>O<sub>3</sub>–stabilized ZrO<sub>2</sub> nanocomposite films

  • Carpenter, Michael A.
  • Efstathiadis, Harry
  • Sirinakis, George
  • Siddique, Rezina
  • Kaloyeros, Alain E.
  • Sun, Lianchao
Abstract

<jats:p>Nanocomposite thin films consisting of Au nanoparticles embedded in yttria-stabilized zirconia (YSZ) were synthesized at room temperature by radio frequency magnetron co-sputtering from YSZ and Au targets and subsequently annealed in an argon atmosphere. Au microstructure and particle size were characterized as a function of annealing temperature from 600 to 1000 °C by x-ray diffraction, transmission electron microscopy, scanning electron microscopy, and Rutherford backscattering spectroscopy. Spectroscopic ellipsometry was also used to determine the optical constants of the resulting films. In particular, the refractive index of the nanocomposites was found to undergo an anomalous dispersion in the spectral region where the extinction coefficient achieves its maximum. Additionally, the incorporation of Au in the YSZ matrix was found to increase the refractive index in comparison to that of YSZ. At annealing temperatures higher than 800 °C, a good agreement was found between experimental findings and theoretical models using bulk dielectric functions for Au, as modified to account for a reduced mean free path for scattering than that for free electrons. However, for annealing temperatures below 800 °C, an additional offset was required for the optical constants of Au to obtain good agreement between theory and experiment. This behavior was attributed to a relatively high atomic Au concentration in the YSZ matrix.</jats:p>

Topics
  • nanoparticle
  • nanocomposite
  • dispersion
  • scanning electron microscopy
  • x-ray diffraction
  • theory
  • experiment
  • thin film
  • transmission electron microscopy
  • ellipsometry
  • annealing
  • spectroscopy