Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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1.080 Topics available

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (6/6 displayed)

  • 2024Integrated multimode optical waveguides in glass using laser induced deep etchingcitations
  • 2022Young’s Modulus and Residual Stresses of Oxide-Free Wire Arc Sprayed Copper Coatingscitations
  • 2022Degeneration Effects of Thin-Film Sensors after Critical Load Conditions of Machine Componentscitations
  • 2021Towards a Highly Sensitive Piezoelectric Nano-Mass Detectio : A Model-Based Concept Studycitations
  • 2020Transfer Printing of Conductive Thin-Films on PDMS with Soluble Substrates for Flexible Biosensors1citations
  • 2016Direct hot embossing of microelements by means of photostructurable polyimidecitations

Places of action

Chart of shared publication
Overmeyer, Ludger
1 / 54 shared
Evertz, Andreas
1 / 2 shared
Basten, Robin
1 / 1 shared
Reitz, Birger
1 / 1 shared
Rodriguez Diaz, Manuel
1 / 2 shared
Raumel, Selina
1 / 1 shared
Möhwald, Kai
1 / 13 shared
Maier, Hans Jürgen
2 / 99 shared
Szafarska, Maik
1 / 6 shared
Gustus, René
1 / 9 shared
Ottermann, Rico
1 / 5 shared
Dencker, Folke
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Steppeler, Tobias
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Glukhovkoy, Anatoly
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Hitzemann, Moritz
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De Wall, Sascha
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Twiefel, Jens
1 / 13 shared
Sehlmeyer, Merle
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Zimmermann, Stefan
1 / 5 shared
Bengsch, Sebastian
1 / 2 shared
Hadeler, Steffen
1 / 1 shared
Prediger, Maren Susanne
1 / 1 shared
Rezem, Maher
1 / 5 shared
Roth, Bernhard
1 / 19 shared
Reithmeier, Eduard
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Akin, Meriem
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Rahlves, Maik
1 / 5 shared
Cromwell, Kevin
1 / 1 shared
Rissing, Lutz
1 / 2 shared
Chart of publication period
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2022
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2016

Co-Authors (by relevance)

  • Overmeyer, Ludger
  • Evertz, Andreas
  • Basten, Robin
  • Reitz, Birger
  • Rodriguez Diaz, Manuel
  • Raumel, Selina
  • Möhwald, Kai
  • Maier, Hans Jürgen
  • Szafarska, Maik
  • Gustus, René
  • Ottermann, Rico
  • Dencker, Folke
  • Steppeler, Tobias
  • Glukhovkoy, Anatoly
  • Hitzemann, Moritz
  • De Wall, Sascha
  • Twiefel, Jens
  • Sehlmeyer, Merle
  • Zimmermann, Stefan
  • Bengsch, Sebastian
  • Hadeler, Steffen
  • Prediger, Maren Susanne
  • Rezem, Maher
  • Roth, Bernhard
  • Reithmeier, Eduard
  • Akin, Meriem
  • Rahlves, Maik
  • Cromwell, Kevin
  • Rissing, Lutz
OrganizationsLocationPeople

article

Degeneration Effects of Thin-Film Sensors after Critical Load Conditions of Machine Components

  • Ottermann, Rico
  • Wurz, Marc Christopher
  • Dencker, Folke
  • Steppeler, Tobias
Abstract

In the context of intelligent components in industrial applications in the automotive, energy or construction sector, sensor monitoring is crucial for security issues and to avoid long and costly downtimes. This article discusses component-inherent thin-film sensors for this purpose, which, in contrast to conventional sensor technology, can be applied inseparably onto the component’s surface via sputtering, so that a maximum of information about the component’s condition can be generated, especially regarding deformation. This article examines whether the sensors can continue to generate reliable measurement data even after critical component loads have been applied. This extends their field of use concerning plastic deformation behavior. Therefore, any change in sensor properties is necessary for ongoing elastic strain measurements. These novel fundamentals are established for thin-film constantan strain gauges and platinum temperature sensors on steel substrates. In general, a k-factor decrease and an increase in the temperature coefficient of resistance with increasing plastic deformation could be observed until a sensor failure above 0.5% plastic deformation (constantan) occurred (1.3% for platinum). Knowing these values makes it possible to continue measuring elastic strains after critical load conditions on a machine component in terms of plastic deformation. Additionally, a method of sensor-data fusion for the clear determination of plastic deformation and temperature change is presented.

Topics
  • impedance spectroscopy
  • surface
  • polymer
  • Platinum
  • steel