Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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Slang, Stanislav

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University of Pardubice

in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (4/4 displayed)

  • 2024Co-sputtered phase-change Ga-Sb-Te thin films1citations
  • 2024Optical and chemical properties of As–Se and As–S–Se solution processed thin films prepared <i>via</i> As<sub>50</sub>Se<sub>50</sub> source solution modificationcitations
  • 2023Solution processed multi-layered thin films of Ge20Sb5S75 and Ge20Sb5Se75 chalcogenide glasses1citations
  • 20192D GeSe<sub>2</sub> amorphous monolayer7citations

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Kotrla, Magdalena
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Gutwirth, Jan
1 / 13 shared
Cheviré, François
1 / 63 shared
Němec, Petr
1 / 18 shared
Prikryl, Jan
1 / 2 shared
Janicek, Petr
2 / 5 shared
Nazabal, Virginie
1 / 125 shared
Halenkovic, Tomas
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Kurka, Michal
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Vlček, Miroslav
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Jančálek, Jiří
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Palka, Karel
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Jemelka, Jiri
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Vlcek, Miroslav
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Jancalek, Jiri
1 / 1 shared
Wagner, Tomas
1 / 2 shared
Svoboda, Roman
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Mikysek, Tomas
1 / 1 shared
Cicmancova, Veronika
1 / 1 shared
Kutalek, Petr
1 / 1 shared
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2024
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2019

Co-Authors (by relevance)

  • Kotrla, Magdalena
  • Gutwirth, Jan
  • Cheviré, François
  • Němec, Petr
  • Prikryl, Jan
  • Janicek, Petr
  • Nazabal, Virginie
  • Halenkovic, Tomas
  • Kurka, Michal
  • Vlček, Miroslav
  • Jančálek, Jiří
  • Palka, Karel
  • Jemelka, Jiri
  • Vlcek, Miroslav
  • Jancalek, Jiri
  • Wagner, Tomas
  • Svoboda, Roman
  • Mikysek, Tomas
  • Cicmancova, Veronika
  • Kutalek, Petr
OrganizationsLocationPeople

article

2D GeSe<sub>2</sub> amorphous monolayer

  • Slang, Stanislav
  • Wagner, Tomas
  • Svoboda, Roman
  • Mikysek, Tomas
  • Cicmancova, Veronika
  • Kutalek, Petr
Abstract

<jats:title>Abstract</jats:title><jats:p>In this paper, GeSe<jats:sub>2</jats:sub> thin film and glass ingot were prepared in a layered structure. Subsequently, the 2D amorphous monolayers were achieved from layered thin film and layered glass ingot. The thicknesses of monolayers from thin film range from 1.5 nm to 5 nm. And the thickness of monolayer from glass ingot is 7 μm. The fast cooling of material results in the formation of self-assembled monolayers. In the case of thin film, layers are connected with “bridge”. After doping of Ag, the precipitation of nano particles exfoliates the adjacent monolayers which can be further dispersed by etching of Ag particles. In the case of glass ingot, the composition changes at 1 % between adjacent monolayers, according to EDX (energy-dispersive X-ray spectroscopy) spectra. And the glass 2D monolayer can be mechanically peeled off from the glass ingot.</jats:p>

Topics
  • impedance spectroscopy
  • amorphous
  • thin film
  • glass
  • glass
  • layered
  • etching
  • precipitation
  • Energy-dispersive X-ray spectroscopy