| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Juodkazis, Saulius
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (12/12 displayed)
- 2024Observation of high-pressure polymorphs in bulk silicon formed at relativistic laser intensitiescitations
- 2023Si-Cr Nano-Alloys Fabricated by Direct Femtosecond Laser Writingcitations
- 2022Microparticles of High Entropy Alloys Made by Laser-Induced Forward Transfercitations
- 2021Distribution states of graphene in polymer nanocomposites : A reviewcitations
- 2018Enhancement of X-ray emission from nanocolloidal gold suspensions under double-pulse excitationcitations
- 2017Megabar pressures in the wake of ultrafast Bessel pulses
- 2015Nano-proximity direct ion beam writingcitations
- 2014Phase Transformation in Laser-Induced Micro-Explosion in Olivine (Fe,Mg)(2)SiO4citations
- 2011Observation of O-2 inside voids formed in GeO2 glass by tightly-focused fs-laser pulses
- 2011Femtosecond laser induced density changes in GeO2 and SiO2 glasses: fictive temperature effect [Invited]
- 2011Laser-induced structural changes in pure GeO2 glassescitations
- 2004Three-dimensional recording and structuring of chalcogenide glasses by femtosecond pulsescitations
Places of action
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article
Nano-proximity direct ion beam writing
Abstract
International audience ; Focused ion beam (FIB) milling with a 10 nm resolution is used to directly write metallic metasurfaces and micro-optical elements capable to create structured light fields. Surface density of fabricated nano-features, their edge steepness as well as ion implantation extension around the cut line depend on the ion beam intensity profile. The FIB beam intensity cross section was evaluated using atomic force microscopy (AFM) scans of milled line arrays on a thin Pt film. Approximation of two Gaussian intensity distributions describes the actual beam profile composed of central high intensity part and peripheral wings. FIB fabrication reaching aspect ratio of 10 in gold film is demonstrated.