Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (6/6 displayed)

  • 2023Operando neutron diffraction reveals mechanisms for controlled strain evolution in 3D printing21citations
  • 2018Effect of Modified Nanoclay Composite on Blended PVDF/PEG Electrolyte Membranes for Fuel Cell Applications6citations
  • 2017Role of structural modifications of montmorillonite, electrical properties effect, physical behavior of nanocomposite proton conducting membranes for direct methanol fuel cell applications4citations
  • 2017Effect of target power on the physical properties of Ti thin films prepared by DC magnetron sputtering with supported discharge7citations
  • 2016Facile synthesis and characterization of a reduced graphene oxide/halloysite nanotubes/hexagonal boron nitride (RGO/HNT/h-BN) hybrid nanocomposite and its potential application in hydrogen storage36citations
  • 2014Effect of Substrate Bias Voltage on the Physical Properties of Zirconium Nitride (<font>ZrN</font>) Films Deposited by Mid Frequency Reactive Magnetron Sputtering3citations

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Chart of shared publication
Plotkowski, Alex
1 / 3 shared
Haley, James
1 / 1 shared
Saleeby, K.
1 / 1 shared
Leach, C.
1 / 2 shared
Madireddy, G.
1 / 1 shared
Babu, S. S.
1 / 12 shared
Yu, D.
1 / 4 shared
Palani, P. Bahavan
2 / 2 shared
Abidin, K. Sainul
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Rajashabala, S.
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Kavitha, A.
2 / 3 shared
Muthu, R. Naresh
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Loganathan, S.
1 / 1 shared
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2023
2018
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2014

Co-Authors (by relevance)

  • Plotkowski, Alex
  • Haley, James
  • Saleeby, K.
  • Leach, C.
  • Madireddy, G.
  • Babu, S. S.
  • Yu, D.
  • Palani, P. Bahavan
  • Abidin, K. Sainul
  • Rajashabala, S.
  • Kavitha, A.
  • Muthu, R. Naresh
  • Loganathan, S.
OrganizationsLocationPeople

article

Effect of target power on the physical properties of Ti thin films prepared by DC magnetron sputtering with supported discharge

  • Kavitha, A.
  • Rajashabala, S.
  • Kannan, R.
Abstract

<jats:title>Abstract</jats:title><jats:p>The present paper describes the effect of target power on the properties of Ti thin films prepared by DC magnetron sputtering with (triode mode) and without (diode mode) supported discharge. The traditional diode magnetron sputtering with an addition of a hot filament has been used to sustain the discharge at a lower pressure. The effect of target power (60, 80, 100 and 120 W) on the physical properties of Ti thin films has been studied in diode and triode modes. XRD studies showed that the Ti thin films prepared at a target power up to 100 W in diode mode were amorphous in nature. The Ti thin films exhibited crystalline structure at much lower target power of 80 W with a preferred orientation along (0 0 2) plane. The grain size of Ti thin films prepared in triode mode increased from 64 nm to 80 nm, whereas in diode mode, the grain size increased from 2 nm to 5 nm. EDAX analysis confirmed that the incorporation of reactive gases was lower in triode mode compared to diode mode. The electrical resistivity of Ti thin films deposited in diode mode was found to be 85 µΩ⋅cm (target power 120 W). The electrical resistivity of Ti thin films in triode mode was found to be deceased to 15.2 µΩ⋅cm (target power 120 W).</jats:p>

Topics
  • amorphous
  • grain
  • resistivity
  • grain size
  • x-ray diffraction
  • thin film
  • reactive
  • Energy-dispersive X-ray spectroscopy