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Czajka, Ryszard
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article
Polymer studies using Atomic Force Microscopy (AFM). Part I. Principles of AFM and its application in polymer morphology investigations
Abstract
<p>On the basis of recent literature data the principles of Atomic Force Microscopy (AFM) and progress in the development of this technique have been reported. Its advantages and shortcomings as well as the possibilities it creates have also been discussed. Application of AFM method for geometric structure of polymer surface determining as well as determining of surface roughness and morphology of polymer blends and copolymers. AFM is especially useful for investigation of the surface defects, impurities, wettability, polymer miscibility, phase separation, selforganized structures and molecular interactions. Owing to AFM the influence of polymer surface morphology on the polymer properties (in nanometer scale) can be estimated.</p>