| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Whelan, Patrick Rebsdorf
Technical University of Denmark
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (12/12 displayed)
- 2024Mapping nanoscale carrier confinement in polycrystalline graphene by terahertz spectroscopycitations
- 2022Chemical Vapor-Deposited Graphene on Ultraflat Copper Foils for van der Waals Hetero-Assemblycitations
- 2021Nonlinear conductivity response of graphene on thin polymeric film detected by reflection-mode air-plasma THz-TDS
- 2020Fermi velocity renormalization in graphene probed by terahertz time-domain spectroscopycitations
- 2019Wafer-Scale Synthesis of Graphene on Sapphire: Toward Fab-Compatible Graphenecitations
- 2019Wafer-Scale Synthesis of Graphene on Sapphire: Toward Fab-Compatible Graphenecitations
- 2018Conductivity mapping of graphene on polymeric films by terahertz time-domain spectroscopycitations
- 2018Non-destructive Thickness Mapping of Wafer-Scale Hexagonal Boron Nitride Down to a Monolayercitations
- 2017Sputtering an exterior metal coating on copper enclosure for large-scale growth of single-crystalline graphene:Papercitations
- 2017Sputtering an exterior metal coating on copper enclosure for large-scale growth of single-crystalline graphenecitations
- 2016Copper Oxidation through Nucleation Sites of Chemical Vapor Deposited Graphenecitations
- 2016Transfer and characterization of large-area CVD graphene for transparent electrode applications
Places of action
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article
Conductivity mapping of graphene on polymeric films by terahertz time-domain spectroscopy
Abstract
Fast inline characterization of the electrical properties of graphene on polymeric substrates is an essential requirement for quality control in industrial graphene production. Here we show that it is possible to measure the sheet conductivity of graphene on polymer films by terahertz time-domain spectroscopy (THz-TDS) when all internally reflected echoes in the substrate are taken into consideration. The conductivity measured by THz-TDS is comparable to values obtained from four point probe measurements. THz-TDS maps of 25x30 cm2 area graphene films were recorded and the DC conductivity and carrier scattering time were extracted from the measurements. Additionally, the THz-TDS conductivity maps highlight tears and holes in the graphene film, which are not easily visible by optical inspection.