Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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1.080 Topics available

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977 Locations available

693.932 PEOPLE
693.932 People People

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Gardes, Frederic Y.

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University of Southampton

in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (9/9 displayed)

  • 20222D material based optoelectronics by electroplatingcitations
  • 2019Tuning silicon-rich nitride microring resonances with graphene capacitors for high-performance computing applications12citations
  • 2015Wavelength division demultiplexer and integrated III-V semiconductor Lasers on a silicon photonics platform with microbubble manipulationcitations
  • 2015Ge-on-Si plasma enhanced chemical vapor deposition for low cost photodetectors16citations
  • 2014Planar surface implanted diffractive grating couplers in SOI28citations
  • 2014Locally erasable couplers for optical device testing in silicon on insulator30citations
  • 2014Silicon diffusion engineering in rapid melt growth of silicon-germanium on insulator1citations
  • 2010Carrier depletion based silicon optical modulators2citations
  • 2010Modulators and photodetectors developed in the framework of the European HELIOS projectcitations

Places of action

Chart of shared publication
Bartlett, Philip N.
1 / 41 shared
Skandalos, Ilias
1 / 2 shared
Thomas, Shibin
1 / 12 shared
Hou, Yaonan
1 / 3 shared
De Groot, Cornelis
1 / 41 shared
Beanland, Richard
1 / 25 shared
Noori, Yasir Jamal
1 / 11 shared
Abdelazim, Nema
1 / 12 shared
Klein, Norbert
1 / 5 shared
Reid, Gillian
1 / 50 shared
Hogan, Benjamin T.
1 / 1 shared
Faneca, Joaquin
1 / 1 shared
Baldycheva, Anna
1 / 2 shared
Diez, Iago R.
1 / 1 shared
Thomson, David J.
2 / 4 shared
Yu, Kyoungsik
1 / 2 shared
Mashanovich, G. Z.
4 / 11 shared
Shim, Jaeho
1 / 2 shared
Reed, G. T.
5 / 8 shared
Jung, Youngho
1 / 2 shared
Hu, Youfang
1 / 1 shared
Wilkinson, James
1 / 34 shared
Thomson, D. J.
3 / 5 shared
Khokhar, A. Z.
1 / 5 shared
Basset, L.
1 / 1 shared
Littlejohns, C. G.
1 / 3 shared
Reynolds, Scott
1 / 1 shared
Hu, Y.
1 / 15 shared
Ofaolain, L.
2 / 3 shared
Topley, R.
1 / 1 shared
Healy, N.
1 / 16 shared
Topley, R. P.
1 / 1 shared
Martinez-Jimenez, G.
1 / 1 shared
Peacock, Anna C.
1 / 47 shared
Payne, D. N. R.
1 / 1 shared
Mashanovich, Goran Z.
1 / 8 shared
Reed, Graham T.
2 / 5 shared
Littlejohns, Callum
1 / 1 shared
Nedeljković, Miloš
1 / 10 shared
Rasigade, Gilles
1 / 1 shared
Crozat, Paul
1 / 4 shared
Vivien, Laurent
1 / 28 shared
Marris-Morini, Delphine
1 / 20 shared
Fédéli, Jean Marc
1 / 1 shared
Cassan, Eric
1 / 28 shared
Brouckaert, J.
1 / 2 shared
Thourhout, D. Van
1 / 1 shared
Fédéli, J. M.
1 / 2 shared
Thomson, D.
1 / 10 shared
Damlencourt, J. F.
1 / 2 shared
Cassan, E.
1 / 5 shared
Marris-Morini, D.
1 / 2 shared
Rasigade, G.
1 / 1 shared
Vivien, L.
1 / 6 shared
Crozat, P.
1 / 6 shared
Osmond, J.
1 / 3 shared
Chart of publication period
2022
2019
2015
2014
2010

Co-Authors (by relevance)

  • Bartlett, Philip N.
  • Skandalos, Ilias
  • Thomas, Shibin
  • Hou, Yaonan
  • De Groot, Cornelis
  • Beanland, Richard
  • Noori, Yasir Jamal
  • Abdelazim, Nema
  • Klein, Norbert
  • Reid, Gillian
  • Hogan, Benjamin T.
  • Faneca, Joaquin
  • Baldycheva, Anna
  • Diez, Iago R.
  • Thomson, David J.
  • Yu, Kyoungsik
  • Mashanovich, G. Z.
  • Shim, Jaeho
  • Reed, G. T.
  • Jung, Youngho
  • Hu, Youfang
  • Wilkinson, James
  • Thomson, D. J.
  • Khokhar, A. Z.
  • Basset, L.
  • Littlejohns, C. G.
  • Reynolds, Scott
  • Hu, Y.
  • Ofaolain, L.
  • Topley, R.
  • Healy, N.
  • Topley, R. P.
  • Martinez-Jimenez, G.
  • Peacock, Anna C.
  • Payne, D. N. R.
  • Mashanovich, Goran Z.
  • Reed, Graham T.
  • Littlejohns, Callum
  • Nedeljković, Miloš
  • Rasigade, Gilles
  • Crozat, Paul
  • Vivien, Laurent
  • Marris-Morini, Delphine
  • Fédéli, Jean Marc
  • Cassan, Eric
  • Brouckaert, J.
  • Thourhout, D. Van
  • Fédéli, J. M.
  • Thomson, D.
  • Damlencourt, J. F.
  • Cassan, E.
  • Marris-Morini, D.
  • Rasigade, G.
  • Vivien, L.
  • Crozat, P.
  • Osmond, J.
OrganizationsLocationPeople

article

Planar surface implanted diffractive grating couplers in SOI

  • Gardes, Frederic Y.
  • Mashanovich, G. Z.
  • Thomson, D. J.
  • Ofaolain, L.
  • Reed, G. T.
  • Topley, R.
Abstract

Grating couplers are used to efficiently couple light from an optical fibre to a silicon waveguide as they allow light to be coupled into or out from any location on the device without the need for cleaving. However, using the typical surface relief grating fabrication method reduces surface planarity and hence makes further processing more difficult. The ability to manufacture high quality material layers on top of a grating coupler allows multiple active optical layers to be realized for multi-layer integrated optical circuits, and may enable monolithic integration of optical and electronic circuits on separate layers. Furthermore, the nature of the refractive index change may enable removal via rapid thermal annealing for wafer scale testing applications. We demonstrate for the first time a coupling device utilising a refractive index change introduced by lattice disorder. Simulations show 44% of the power can be extracted from the waveguide by using uniform implanted gratings, which is not dissimilar to the performance of typical uniform surface relief gratings currently used. Losses determined empirically, of 5.5dB per coupler have been demonstrated. (C) 2013 Optical Society of America

Topics
  • impedance spectroscopy
  • surface
  • simulation
  • Silicon
  • annealing