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Naji, M. |
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Motta, Antonella |
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Aletan, Dirar |
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Mohamed, Tarek |
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Ertürk, Emre |
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Taccardi, Nicola |
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Kononenko, Denys |
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Petrov, R. H. | Madrid |
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Alshaaer, Mazen | Brussels |
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Bih, L. |
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Casati, R. |
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Muller, Hermance |
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Kočí, Jan | Prague |
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Šuljagić, Marija |
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Kalteremidou, Kalliopi-Artemi | Brussels |
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Azam, Siraj |
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Ospanova, Alyiya |
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Blanpain, Bart |
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Ali, M. A. |
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Popa, V. |
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Rančić, M. |
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Ollier, Nadège |
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Azevedo, Nuno Monteiro |
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Landes, Michael |
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Rignanese, Gian-Marco |
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Patorski, Krzysztof
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Publications (9/9 displayed)
- 2016Surface flatness measurement of quasi-parallel plates employing three-beam interference with strong reference beam
- 2016Subtractive two-frame three-beam phase-stepping interferometry for testing surface shape of quasi-parallel plates citations
- 2015Three-beam interferogram analysis method for surface flatness testing of glass plates and wedgescitations
- 2014Evaluation of optical parameters of quasi-parallel plates with single-frame interferogram analysis methods and eliminating the influence of camera parasitic fringescitations
- 2014Optical metrology with Hilbert-Huang fringe pattern analysis for experimental mechanics
- 2013Highly contrasted Bessel fringe minima visualization for time-averaged vibration profilometry using Hilbert transform two-frame processingcitations
- 2012Continuous wavelet transform for d-space distribution analysis in nanocrystallic materialscitations
- 2008Quasi-parallel glass plate measurements using Fizeau interferometercitations
- 2007Derivation of quasi-parallel glass plate parameters tested in a Fizeau interferometercitations
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article
Highly contrasted Bessel fringe minima visualization for time-averaged vibration profilometry using Hilbert transform two-frame processing
Abstract
Time-averaged fringe patterns in vibration testing of microelements are unaffected by carrier displacements and are additive type moirés. These features and Hilbert transform vulnerability to additive trend are utilized for visualization of centers of dark Bessel fringes. Two frames withshifted carrier are subtracted for background and noise correction. Two normalized images of this pattern are calculated with slightly different bias levels and subtracted. The method does not require precise phase shifting between two frames, cosinusoidal carrier and linear recording. It enablesdetecting light power variations and phase shifting nonuniformities. Synthetic and experimental results corroborate the robustness of the method.