Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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Beermann, Jonas

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University of Southern Denmark

in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (6/6 displayed)

  • 2017Near- and far field spectroscopy of semi-continuous gold films with optically induced anisotropy.citations
  • 2017Near- and far field spectroscopy of semi-continuous gold films with optically induced anisotropy.citations
  • 2017Optical reconfiguration and polarization control in semicontinuous gold films close to the percolation thresholdcitations
  • 2017Optical reconfiguration and polarization control in semicontinuous gold films close to the percolation thresholdcitations
  • 2011Field enhancement and extraordinary optical transmission by tapered periodic slits in gold films35citations
  • 2011Localized field enhancements in two-dimensional V-groove metal arrays15citations

Places of action

Chart of shared publication
Styrk-Geisler, Mathias
2 / 5 shared
Stenger, Nicolas
4 / 14 shared
Novikov, Sergey M.
6 / 12 shared
Bozhevolnyi, Sergey I.
6 / 35 shared
Frydendahl, Christian
4 / 5 shared
Repän, Taavi
4 / 8 shared
Lavrinenko, Andrei V.
2 / 98 shared
Mortensen, N. Asger
4 / 30 shared
Geisler, Mathias
2 / 4 shared
Lavrinenko, Andrei
2 / 32 shared
Xiao, Sanshui
2 / 6 shared
Ebbesen, Tw
1 / 1 shared
Devaux, E.
1 / 9 shared
Søndergaard, T.
2 / 4 shared
Pedersen, K.
1 / 4 shared
Rafaelsen, J.
1 / 2 shared
Chart of publication period
2017
2011

Co-Authors (by relevance)

  • Styrk-Geisler, Mathias
  • Stenger, Nicolas
  • Novikov, Sergey M.
  • Bozhevolnyi, Sergey I.
  • Frydendahl, Christian
  • Repän, Taavi
  • Lavrinenko, Andrei V.
  • Mortensen, N. Asger
  • Geisler, Mathias
  • Lavrinenko, Andrei
  • Xiao, Sanshui
  • Ebbesen, Tw
  • Devaux, E.
  • Søndergaard, T.
  • Pedersen, K.
  • Rafaelsen, J.
OrganizationsLocationPeople

article

Localized field enhancements in two-dimensional V-groove metal arrays

  • Beermann, Jonas
  • Novikov, Sergey M.
  • Pedersen, K.
  • Bozhevolnyi, Sergey I.
  • Rafaelsen, J.
  • Søndergaard, T.
Abstract

We investigate field enhancements in two-dimensional 800 nm periodic arrays of (108–121 nm deep) V-grooves (opening angles 38°–75°) fabricated using focused ion beam milling in a 190 nm thick gold film on top of a fused silica substrate. Simulated and experimental reflection spectra, high-resolution two-photon luminescence (TPL) images, and microscopy of surface-enhanced Raman scattering (SERS) obtained from the V-groove metal arrays are compared and reveal good correspondence in the spectral dependences of reflection and local TPL as well as SERS measured at the groove bottom. We relate the obtained field intensity enhancements, reaching ∼85 with nanofocusing and resonant interference of counterpropagating plasmons by the periodic closed tapered groove gaps. The achieved reflection spectra and enhancements depend on the geometry of the V-groove arrays and can actually be tuned in the wavelength range from visible to infrared, making this configuration promising for a wide range of practical applications, e.g., within surface-enhanced spectroscopies.

Topics
  • surface
  • grinding
  • gold
  • milling
  • focused ion beam
  • two-dimensional
  • microscopy
  • luminescence