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Naji, M. |
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Motta, Antonella |
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Aletan, Dirar |
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Mohamed, Tarek |
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Ertürk, Emre |
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Taccardi, Nicola |
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Kononenko, Denys |
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Petrov, R. H. | Madrid |
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Alshaaer, Mazen | Brussels |
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Bih, L. |
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Casati, R. |
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Muller, Hermance |
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Kočí, Jan | Prague |
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Šuljagić, Marija |
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Kalteremidou, Kalliopi-Artemi | Brussels |
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Azam, Siraj |
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Ospanova, Alyiya |
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Blanpain, Bart |
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Ali, M. A. |
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Popa, V. |
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Rančić, M. |
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Ollier, Nadège |
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Azevedo, Nuno Monteiro |
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Landes, Michael |
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Rignanese, Gian-Marco |
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Sugden, Kate
Aston University
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (8/8 displayed)
- 2020Bragg gratings inscribed in solid-core microstructured single-mode polymer optical fiber drawn from a 3D-printed polycarbonate preformcitations
- 2020Bragg gratings inscribed in solid-core microstructured single-mode polymer optical fiber drawn from a 3D-printed polycarbonate preform
- 2016Microstructured polymer optical fibre sensors for opto-acoustic endoscopycitations
- 2011Photonic crystal fiber Bragg grating based sensors: opportunities for applications in healthcarecitations
- 2011Embedded multiplexed polymer optical fiber sensor for esophageal manometrycitations
- 2011Embedded multiplexed polymer optical fiber sensor for esophageal manometrycitations
- 2011Photonic crystal fiber Bragg grating based sensorscitations
- 2011Femtosecond laser micro-inscription of optical coherence tomography resolution test artifactscitations
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article
Femtosecond laser micro-inscription of optical coherence tomography resolution test artifacts
Abstract
Optical coherence tomography (OCT) systems are becoming more commonly used in biomedical imaging and, to enable continued uptake, a reliable method of characterizing their performance and validating their operation is required. This paper outlines the use of femtosecond laser subsurface micro-inscription techniques to fabricate an OCT test artifact for validating the resolution performance of a commercial OCT system. The key advantage of this approach is that by utilizing the nonlinear absorption a three dimensional grid of highly localized point and line defects can be written in clear fused silica substrates. <br/>