Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (2/2 displayed)

  • 2024Unsupervised topological analysis of polarized light microscopycitations
  • 2023Enhanced quantitative birefringence imaging supported by unsupervised topological analysis of polarized light microscopycitations

Places of action

Chart of shared publication
Yans, Johan
1 / 5 shared
Deparis, Olivier
2 / 24 shared
Poot, Julien
1 / 2 shared
Roy, Nicolas
2 / 3 shared
Dekoninck, Augustin
1 / 2 shared
Chart of publication period
2024
2023

Co-Authors (by relevance)

  • Yans, Johan
  • Deparis, Olivier
  • Poot, Julien
  • Roy, Nicolas
  • Dekoninck, Augustin
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article

Unsupervised topological analysis of polarized light microscopy

  • Yans, Johan
  • Deparis, Olivier
  • Poot, Julien
  • Roy, Nicolas
  • Dekoninck, Augustin
  • Bouhy, Julie
Abstract

The determination of birefringence (magnitude and axis orientation) of optical materials is of significant interest in various fields. In the case of composite samples, this task becomes complicated and time-consuming; therefore, a partially automated procedure for reconstructing birefringence spatial distribution becomes valuable. Herein, we propose a procedure to reconstruct the spatial distributions of the retardance and optical axis orientation in a geological thin section from sparse quantitative birefringence measurements, using automatic boundary detection on cross-polarized light microscopy images. We examine two particular areas on the selected geological thin section: one that presents a uniaxial crystal with a circular cross-section of its refractive index ellipsoid and the other with grains of varying orientations. The measurement gives the orientation of the grain’s optical axis both in and out of the plane of the thin section, which explains the qualitative observations with the cross-polarized light microscope. Future work will connect the measured orientation of the rock thin section with its 3D geological orientation in the field.

Topics
  • impedance spectroscopy
  • grain
  • composite
  • Polarized light microscopy