• Szewczyk, Roman

Abstract

Possibilities of the modeling of the flux density distribution in thin films are significantly limited using thefinite elements method due to the fast increase of the number of tetrahedral elementary cells with reduction of thethickness. For this reason, method of the moments is very important alternative for finite elements method in thecase of thin layers, where layer’s thickness should be considered. Method of the moments overcomes this barrier,due to the possibility of operation on uniform grids with limited number of cells. Moreover, in opposite to thefinite elements method, the method of the moments requires solving of the well defined linear equations, insteadof the set of ill-posed differential equations. Paper presents the generalization of the method of the moments forthin layers with given thickness. Layers are defined as the 2D rectangular grids. Within the generalization, fourkey equations describing the influence of rectangular cell’s border on the magnetization of cells are stated. On thebase of these dependences, the set of 2NMlinear equations was determined, whereNandMare the numbers ofrectangular cells in the rows and columns of regular grid. Finally, the set of linear equations is solved and magneticflux density distribution in the thin layer is calculated

Topics

• density
• impedance spectroscopy
• thin film
• magnetization