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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Patil, Prashant
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Publications (6/6 displayed)
- 2021Utility of Nucleic Acid Extraction Free COVID-19 Real Time PCR Protocol in Resource Limited Setting: A Pilot Study
- 2021Controlling draw resonance during extrusion film casting of nanoclay filled linear low-density polyethylene: An experimental study and numerical linear stability analysiscitations
- 2021APTES monolayer coverage on self-assembled magnetic nanospheres for controlled release of anticancer drug Nintedanibcitations
- 2021Laboratory Diagnosis of SARS Corona Virus-2 Infection: Single Centre Experience of First 12,000 Samples
- 2020Pulsed laser deposited CoFe2O4 thin films as supercapacitor electrodescitations
- 2008Magnetotransport and Structural Properties of Nanocrystalline FeAgAl Thin Filmscitations
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article
Magnetotransport and Structural Properties of Nanocrystalline FeAgAl Thin Films
Abstract
<jats:p>Structural and magnetotransport properties of metallic Fe<jats:sub><jats:italic>x</jats:italic></jats:sub>Ag<jats:sub><jats:italic>y</jats:italic></jats:sub>Al<jats:sub><jats:italic>z</jats:italic></jats:sub> nanogranular thin films were studied. These films with several compositions were prepared by dc magnetron sputtering. X-ray diffraction (XRD) measurements carried outon the samples show only Ag(111) peaks. The <jats:italic>d</jats:italic>-spacings determined from the Ag(111) peaks are smaller than the standard value for bulk Ag indicating a partial substitution of Fe and Al atoms in Ag matrix. Transmission electron diffraction (TEM) patterns show a number of Ag rings. BothXRD and TEM studies did not reveal any diffraction peaks due to Fe or Al. The average particle size determined from the TEM micrograph is 5.9 nm. This value is in good agreement with the grain size determined from the XRD patterns for the Al substituted samples. The MR was found to increasefor smaller Al concentration and it decreases with further increase in Al content. In the samples investigated magnetoresistance ratio reaches a maximum value of about 4.5% for the Fe<jats:sub>27</jats:sub> Ag<jats:sub>63</jats:sub>Al<jats:sub>10</jats:sub> film.</jats:p>