Materials Map

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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Romaguera Barcelay, Y.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (7/7 displayed)

  • 2021Fractal-Stereometric Correlation of Nanoscale Spatial Patterns of GdMnO3 Thin Films Deposited by Spin Coating16citations
  • 2021Investigation of Stereometric and Fractal Patterns of Spin-Coated LuMnO3 Thin Films9citations
  • 2019La0.59Li0.24TiO3 ceramics obtained by spark plasma sintering: electric behavior analysis9citations
  • 2014Structural, electrical and magnetic properties of magnetoelectric GdMnO3 thin films prepared by a sol-gel method31citations
  • 2012Structural and electrical properties of LuMnO3 thin film prepared by chemical solution method5citations
  • 2012Low-temperature dielectric response of NaTaO3 ceramics and films26citations
  • 2011Synthesis of orthorhombic rare-earth manganite thin films by a novel chemical solution route23citations

Places of action

Chart of shared publication
Oliveira, Rmpb
1 / 1 shared
Matos, Rs
2 / 2 shared
De Cruz, Jp
2 / 2 shared
Da Fonseca, Hd
2 / 2 shared
Talu, S.
2 / 3 shared
Moreira, Ja
3 / 24 shared
Almeida, A.
6 / 78 shared
Marques, Ihg
1 / 1 shared
Leyet, Y.
1 / 2 shared
Agostinho Moreira, Ja
4 / 29 shared
Silva, Rs
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Anglada Rivera, J.
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Poyato, R.
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Pereira, Js
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Guerrero, F.
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Zulueta, Y.
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Sales Jr, Jcc
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Gallardo, A.
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Tavares, Pb
1 / 26 shared
Perez De La Cruz, Jp
3 / 8 shared
Tkach, A.
1 / 29 shared
Vilarinho, Pm
1 / 24 shared
Araujo, Jp
1 / 91 shared
De La Cruz, Jp
1 / 4 shared
Gonzalez Aguilar, G.
1 / 1 shared
Chart of publication period
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2019
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Co-Authors (by relevance)

  • Oliveira, Rmpb
  • Matos, Rs
  • De Cruz, Jp
  • Da Fonseca, Hd
  • Talu, S.
  • Moreira, Ja
  • Almeida, A.
  • Marques, Ihg
  • Leyet, Y.
  • Agostinho Moreira, Ja
  • Silva, Rs
  • Anglada Rivera, J.
  • Poyato, R.
  • Pereira, Js
  • Guerrero, F.
  • Zulueta, Y.
  • Sales Jr, Jcc
  • Gallardo, A.
  • Tavares, Pb
  • Perez De La Cruz, Jp
  • Tkach, A.
  • Vilarinho, Pm
  • Araujo, Jp
  • De La Cruz, Jp
  • Gonzalez Aguilar, G.
OrganizationsLocationPeople

article

Investigation of Stereometric and Fractal Patterns of Spin-Coated LuMnO3 Thin Films

  • Matos, Rs
  • Romaguera Barcelay, Y.
  • De Cruz, Jp
  • Da Fonseca, Hd
  • Almeida, A.
  • Talu, S.
  • Moreira, Ja
  • Marques, Ihg
Abstract

In this paper, we have performed qualitative and quantitative analysis of LuMnO3 thin films surfaces, deposited by spin coating over Pt(111)/TiO2/SiO2/Si substrates, to evaluate their spatial patterns as a function of the film's sintering temperature. Atomic force microscopy was employed to obtain topographic maps that were extensively analyzed via image processing techniques and mathematical tools. 3D (three-dimensional) topographical images revealed that films sintered at 650 degrees C and 750 degrees C presented the formation of smoother surfaces, while the film sintered at 850 degrees C displayed a rougher surface with a root mean square roughness of similar to 2.5 nm. On the other direction, the height distribution of the surface for all films has similar asymmetries and shape, although the film sintered using the highest temperature showed the lower density of rough peaks and a sharper peak shape. The advanced fractal parameters revealed that the film sintered at 850 degrees C is dominated by low spatial frequencies, showing less spatial complexity, higher microtexture homogeneity, and uniform height distribution. These results suggest that the combination of stereometric and fractal parameters can be especially useful for identification of unique topographic spatial patterns in LuMnO3 thin films, helping in their implementation in technological applications, such as photovoltaic solar cells and information magnetic date storage and spintronic devices.

Topics
  • density
  • impedance spectroscopy
  • surface
  • thin film
  • atomic force microscopy
  • laser emission spectroscopy
  • sintering
  • quantitative determination method
  • spin coating