Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 2012Synthesis and Characterization of Pb(ZrᵼE.ᵽ3ᵽ1, TiᵼE.ᵽ2ᵽ5)Oᵽ1-Pb(NbᵼF/ᵽ1, Znᵽ0/ᵽ1)Oᵽ1 Thin Film Cantilevers for Energy Harvesting Applications1citations

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Fuentes-Fernandez, Erika
1 / 1 shared
Debray-Mechtaly, W.
1 / 2 shared
Quevedo-Lopez, M. A.
1 / 2 shared
Shah, P.
1 / 2 shared
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2012

Co-Authors (by relevance)

  • Fuentes-Fernandez, Erika
  • Debray-Mechtaly, W.
  • Quevedo-Lopez, M. A.
  • Shah, P.
OrganizationsLocationPeople

article

Synthesis and Characterization of Pb(ZrᵼE.ᵽ3ᵽ1, TiᵼE.ᵽ2ᵽ5)Oᵽ1-Pb(NbᵼF/ᵽ1, Znᵽ0/ᵽ1)Oᵽ1 Thin Film Cantilevers for Energy Harvesting Applications

  • Fuentes-Fernandez, Erika
  • Debray-Mechtaly, W.
  • Gnade, B.
  • Quevedo-Lopez, M. A.
  • Shah, P.
Abstract

A complete analysis of the morphology, crystallographic orientation, and resulting electrical properties of Pb(Zr0.53,Ti0.47) Pb(Nb1/3, Zn2/3)O3 (PZT-PZN) thin films, as well as the electrical behavior when integrated in a cantilever for energy harvesting applications, is presented. The PZT-PZN films were deposited using sol-gel methods. We report that using 20% excess Pb, a nucleation layer of PbTiO3 (PT), and a fast ramp rate provides large grains, as well as denser films. The PZT-PZN is deposited on a stack of TiO2/PECVD SiO2/Si3N4/thermal SiO2/Poly-Si/Si. This stack is designed to allow wet-etching the poly-Si layer to release the cantilever structures. It was also found that the introduction of the poly-Si layer results in larger grains in the PZT-PZN film. PZT-PZN films with a dielectric constant of 3200 and maximum polarization of 30 μC/cm2 were obtained. The fabricated cantilever devices produced ~300–400 mV peak-to-peak depending on the cantilever design. Experimental results are compared with simulations.

Topics
  • impedance spectroscopy
  • grain
  • thin film
  • simulation
  • dielectric constant
  • etching