Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (4/4 displayed)

  • 2023Realization of Conductive n‐Type Doped <i>α</i>‐Ga<sub>2</sub>O<sub>3</sub> on <i>m</i>‐Plane Sapphire Grown by a Two‐Step Pulsed Laser Deposition Process16citations
  • 2023Ultrawide bandgap willemite-type Zn<sub>2</sub>GeO<sub>4</sub> epitaxial thin films8citations
  • 2022Band Alignment of Al<sub>2</sub>O<sub>3</sub> on α-(Al<sub>x</sub>Ga<sub>1-x</sub>)<sub>2</sub>O<sub>3</sub>5citations
  • 2019Native Point Defect Measurement and Manipulation in ZnO Nanostructures19citations

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Chart of shared publication
Splith, Daniel
1 / 5 shared
Grundmann, Marius
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Petersen, Clemens
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Schultz, Thorsten
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Koch, Norbert
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Kneiß, Max
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Vogt, Sofie
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Lange, Stefan
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Pearton, Stephen
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Al-Mamun, Nahid Sultan
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Ren, Fan
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Foster, Geoffrey
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Look, David
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Jarjour, Alexander
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Cox, Jonathan
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Gao, Hantian
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Ruane, William
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Chart of publication period
2023
2022
2019

Co-Authors (by relevance)

  • Splith, Daniel
  • Grundmann, Marius
  • Petersen, Clemens
  • Schultz, Thorsten
  • Koch, Norbert
  • Kneiß, Max
  • Vogt, Sofie
  • Lange, Stefan
  • Lorenz, Michael
  • Yu, Jingjing
  • Hagendorf, Christian
  • Trefflich, Lukas
  • Höche, Thomas
  • Luo, Sijun
  • Hildebrandt, Ron
  • Selle, Susanne
  • Sturm, Chris
  • Krüger, Evgeny
  • Haque, Aman
  • Hassa, Anna
  • Xia, Xinyi
  • Fares, Chaker
  • Pearton, Stephen
  • Al-Mamun, Nahid Sultan
  • Ren, Fan
  • Foster, Geoffrey
  • Look, David
  • Jarjour, Alexander
  • Cox, Jonathan
  • Gao, Hantian
  • Ruane, William
OrganizationsLocationPeople

article

Band Alignment of Al<sub>2</sub>O<sub>3</sub> on α-(Al<sub>x</sub>Ga<sub>1-x</sub>)<sub>2</sub>O<sub>3</sub>

  • Haque, Aman
  • Hassa, Anna
  • Xia, Xinyi
  • Grundmann, Marius
  • Fares, Chaker
  • Pearton, Stephen
  • Al-Mamun, Nahid Sultan
  • Wenckstern, Holger Von
  • Ren, Fan
Abstract

<jats:p>X Ray Photoelectron Spectroscopy was used to measure valence band offsets for Al<jats:sub>2</jats:sub>O<jats:sub>3</jats:sub> deposited by Atomic Layer Deposition on <jats:italic>α</jats:italic>-(Al<jats:sub>x</jats:sub>Ga<jats:sub>1-x</jats:sub>)<jats:sub>2</jats:sub>O<jats:sub>3</jats:sub> alloys over a wide range of Al contents, x, from 0.26–0.74, corresponding to a bandgap range from 5.8–7 eV. These alloys were grown by Pulsed Laser Deposition. The band alignments were type I (nested) at x &lt;0.5, with valence band offsets 0.13 eV for x = 0.26 and x = 0.46. At higher Al contents, the band alignment was a staggered alignment, with valence band offsets of − 0.07 eV for x = 0.58 and −0.17 for x = 0.74, ie. negative valence band offsets in both cases. The conduction band offsets are also small at these high Al contents, being only 0.07 eV at x = 0.74. The wide bandgap of the <jats:italic>α</jats:italic>-(Al<jats:sub>x</jats:sub>Ga<jats:sub>1-x</jats:sub>)<jats:sub>2</jats:sub>O<jats:sub>3</jats:sub> alloys makes it difficult to find dielectrics with nested band alignments over the entire composition range.</jats:p>

Topics
  • pulsed laser deposition
  • photoelectron spectroscopy
  • atomic layer deposition