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Gomez-Salazar, Sergio
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article
Voltammetric Study of Dental Solid Amalgams in HCl and their Application for Detecting Cu(II) Ions in Solution
Abstract
<jats:p>A voltammetric characterization of a dental amalgam and simple solid metal amalgams and their applications for detecting low concentrations of Cu(II) ions in solution is presented.Dental amalgams display a series of oxidation peaks characteristic of the different metal phases present.A reaction between deposited copper and γ2-Sn7-8Hg phase which transforms into a η'-Cu6Sn5 phase has been proposed to explain the well defined oxidation peaks in the potential range of-0.2 to 0.1 V vs. SCE.Dental amalgams were not found suitable for detecting Cu(II) ions in solution, due to the interference between the γ2-Sn7-8Hg oxidation peak and the copper stripping peak.Instead of a dental amalgam a silver amalgam, i.e, Ag-Hg, is recommended as a better option for detecting Cu(II) ions in solution at low concentrations.It yields a well defined oxidation peaks for copper stripping without having interfering oxidation peaks for the amalgam phase oxidation.</jats:p>