Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (3/3 displayed)

  • 2019Synthesis and Characterization of Ni-doped ZnO Thin Films Grown by Sol-Gel Spin Coating1citations
  • 2017The effect of rapid thermal annealing to device performance of InGaAs/AlGaAs quantum well laser diodescitations
  • 2006Effect of rapid thermal annealing on the atomic intermixing of Zn- and C-doped InGaAs/AlGaAs quantum well laser structures7citations

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Pakabu, Monika
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Aryanto, Didik
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Rauf, N.
1 / 1 shared
Juarlin, E.
1 / 1 shared
Buda, M.
2 / 9 shared
Petravic, M.
1 / 2 shared
Chart of publication period
2019
2017
2006

Co-Authors (by relevance)

  • Pakabu, Monika
  • Aryanto, Didik
  • Rauf, N.
  • Juarlin, E.
  • Buda, M.
  • Petravic, M.
OrganizationsLocationPeople

article

Effect of rapid thermal annealing on the atomic intermixing of Zn- and C-doped InGaAs/AlGaAs quantum well laser structures

  • Petravic, M.
  • Gareso, P. L.
  • Buda, M.
Abstract

<p>We have studied the effect of annealing on the atomic intermixing of Zn- and C-doped InGaAs/AlGaAs laser structures. Electrochemical capacitance voltage measurements revealed that the carrier concentration in the Zn-doped GaAs contact layers decreased after annealing at 900°C for 60 s. indicating that some of the Zn acceptors were passivated or outdiffused from the surface, whereas in the C-doped samples there was an increase of the camer concentration after annealing. This latter was confirmed by X-ray rocking curve results where there was an increase in the amount of lattice contraction associated with the presence of the substitutional carbon C<sub>As</sub> after annealing. Secondary ion mass spectroscopy revealed that the Zn diffused significantly from the top layers to the rest of the structures after annealing at 925 °C, but the SIMS profile did not change significantly for C-doped samples with annealing. This indicates that Zn has a much higher mobility in comparison to carbon. Photoluminescence measurements after etching the samples to various depths showed similar luminescence defects in both Zn- and C-doped samples. The possible mechanism of atomic intermixing for bom Zn- and C-doped samples are discussed.</p>

Topics
  • surface
  • photoluminescence
  • Carbon
  • mobility
  • etching
  • defect
  • annealing
  • selective ion monitoring