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Naji, M. |
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Motta, Antonella |
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Aletan, Dirar |
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Mohamed, Tarek |
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Ertürk, Emre |
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Taccardi, Nicola |
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Kononenko, Denys |
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Petrov, R. H. | Madrid |
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Alshaaer, Mazen | Brussels |
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Bih, L. |
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Casati, R. |
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Muller, Hermance |
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Kočí, Jan | Prague |
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Šuljagić, Marija |
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Kalteremidou, Kalliopi-Artemi | Brussels |
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Azam, Siraj |
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Ospanova, Alyiya |
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Blanpain, Bart |
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Ali, M. A. |
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Popa, V. |
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Rančić, M. |
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Ollier, Nadège |
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Azevedo, Nuno Monteiro |
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Landes, Michael |
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Rignanese, Gian-Marco |
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Hemmous, M.
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Publications (4/4 displayed)
- 2023Silicon-doped nanostructured Fe80Ni20 alloys: the role of si on the microstructure, morphology and magnetic properties
- 2021STRUCTURE, MORPHOLOGY AND MAGNETIC PROPERTIES OF ELECTRODEPOSITED NI FILMScitations
- 2020Nickel-doped nanostructured Fe70Al30 alloys: The role of Ni on the microstructure and the evolution of hyperfine and magnetic propertiescitations
- 2019MOKE Magnetometer Studies of Evaporated Ni and Ni/Cu Thin Films onto Different Substratescitations
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article
MOKE Magnetometer Studies of Evaporated Ni and Ni/Cu Thin Films onto Different Substrates
Abstract
The Magneto-Optic Kerr Effect (MOKE) technique has been used to investigate the magnetic properties of Ni thin films, with thickness t ranging from 9 to 163 nm, evaporated onto several substrates (glass, Si (111), mica and Cu) with and without an evaporated Cu underlayer. The MOKE observations were correlated with the surface morphology inferred from Scanning Electron Microscope images and with the structural properties (grain size and strain). Some interesting behaviors of the coercive field (with values in the 2 to 151 Oe range), the squareness (between 0.1 and 0.91) and the saturation field (25 to 320 Oe) are observed as a function of t, the substrate and the Cu underlayer. A thickness dependent stress-induced anisotropy is found in these films. The differences between the present MOKE results and the ones obtained from the Vibrating Sample magnetometer (VSM) are highlighted. The former describe the surface magnetism of these systems, while the latter are attributed to the whole volume of the sample.