| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Azizi, A.
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Topics
Publications (4/4 displayed)
- 2021In-Depth Metallurgical and Microstructural Analysis of Oneshape and Heat Treated Onecurve Instrumentscitations
- 2021In-depth metallurgical and microstructural analysis of oneshape and heat treated onecurve instruments
- 2021STRUCTURE, MORPHOLOGY AND MAGNETIC PROPERTIES OF ELECTRODEPOSITED NI FILMScitations
- 2013The effect of the temperature on the electrochemical properties of the hydrogen storage alloy for nickel-metal hydride accumulatorscitations
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article
STRUCTURE, MORPHOLOGY AND MAGNETIC PROPERTIES OF ELECTRODEPOSITED NI FILMS
Abstract
Ni thin films have been electrodeposited on [Formula: see text]-Si (100) substrates for different deposition times at a fixed potential of 2[Formula: see text]V. The as-elaborated films have been characterized by Rutherford backscattering spectroscopy (RBS), X-ray diffraction (XRD), atomic force microscopy (AFM) and vibrating sample magnetometry (VSM). From RBS spectra, we have extracted the Ni film thicknesses, [Formula: see text], which ranges from 105 nm to 710 nm. The analysis of XRD spectra shows the existence of a strong [Formula: see text]111[Formula: see text] texture for all film thicknesses. The strain values [Formula: see text] are negative for all Ni films indicating that they are under compressive stresses. The grains size, [Formula: see text], increases to reach a maximum for [Formula: see text][Formula: see text]nm then decreases again with increasing [Formula: see text][Formula: see text](nm). From AFM images, we have shown that the films become progressively smoother with increasing thickness. We have shown that the coercive field measured in parallel geometry, [Formula: see text], increases with increasing thickness.