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Naji, M. |
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Motta, Antonella |
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Aletan, Dirar |
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Mohamed, Tarek |
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Ertürk, Emre |
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Taccardi, Nicola |
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Kononenko, Denys |
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Petrov, R. H. | Madrid |
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Alshaaer, Mazen | Brussels |
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Bih, L. |
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Casati, R. |
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Muller, Hermance |
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Kočí, Jan | Prague |
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Šuljagić, Marija |
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Kalteremidou, Kalliopi-Artemi | Brussels |
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Azam, Siraj |
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Ospanova, Alyiya |
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Blanpain, Bart |
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Ali, M. A. |
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Popa, V. |
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Rančić, M. |
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Ollier, Nadège |
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Azevedo, Nuno Monteiro |
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Landes, Michael |
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Rignanese, Gian-Marco |
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Torres, J.
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Publications (6/6 displayed)
- 2022OP02 The breastmilk proteomics of women with Inflammatory Bowel Disease (IBD) and its impact on fecal calprotectin and microbiota composition in their babiescitations
- 2019Massless Dirac fermions in III-V semiconductor quantum wellscitations
- 2017Estudo dos parâmetros de controlo de um sistema laboratorial de laser cladding
- 2006Template synthesis of carbon nanotubes from porous alumina matrix on siliconcitations
- 2006Fabrication of SOI photonic crystal slabs by soft UV-nanoimprint lithographycitations
- 2002POROUS SILICON DIELECTRIC FUNCTION MODELING FROM EFFECTIVE MEDIUM THEORIEScitations
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article
POROUS SILICON DIELECTRIC FUNCTION MODELING FROM EFFECTIVE MEDIUM THEORIES
Abstract
<jats:p> The spectral variation of the effective dielectric constant in porous silicon thin films is modeled using effective medium theories. The pores in the material are supposed to be spheroid prolate inclusions in a homogeneous matrix. We employ modified Maxwell–Garnett and Bruggeman expressions obtained from previous work. Fitting to experimental reflectance spectra and the refractive index at the visible spectral range is satisfactory. Best results in both models are obtained using the spheroidal inclusions of 0.9 eccentricity. The best adjusted porosity values for two samples with different parameters of preparation are 47% with Bruggeman's expression and 67% with Maxwell–Garnett's expression, which are very close to the experimental ones of 44% and 67% respectively, obtained through gravimetric methods. Our model is useful for determining and for checking the influence of the preparation parameters on the optical and structural properties. </jats:p>