693.932 PEOPLE
| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Teodoro, Orlando
Universidade Nova de Lisboa
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (16/16 displayed)
- 2023Amorphous carbon thin filmscitations
- 2023The Role of Hydrogen Incorporation into Amorphous Carbon Films in the Change of the Secondary Electron Yieldcitations
- 2020Free-standing N-Graphene as conductive matrix for Ni(OH)2 based supercapacitive electrodescitations
- 2019Nanocomposite thin films based on Au-Ag nanoparticles embedded in a CuO matrix for localized surface plasmon resonance sensingcitations
- 2018Development of Au/CuO nanoplasmonic thin films for sensing applicationscitations
- 2016Surface modifications on as-grown boron doped CVD diamond films induced by the B2O3-ethanol-Ar systemcitations
- 2014Ion-plasma treatment of reed switch contactscitations
- 2013Amorphous Carbon Coatings: Temperature Effect on Secondary Electron Yield (SEY)
- 2013Study of SEY degradation of amorphous carbon coatings
- 2013Increase of secondary electron yield of amorphous carbon coatings under high vacuum conditionscitations
- 2012An upgraded TOF-SIMS VG Ionex IX23LS: Study on the negative secondary ion emission of III-V compound semiconductors with prior neutral cesium depositioncitations
- 2012TOF-SIMS study of cystine and cholesterol stonescitations
- 2009Characterisation of DLC Films Deposited Using Titanium Isopropoxide (TIPOT) at Different Flow Ratescitations
- 2006Characterisation of metal/mould interface on investment casting of γ-TiAlcitations
- 2005Evaluation of y2O3 as front layer of ceramic crucibles for vaccum induction melting of TiAl based alloys
- 2002Anomalous growth of Ba on Ag(111)citations
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article
Ion-plasma treatment of reed switch contacts
Abstract
<p>A TOF.SIMS-5 time-of-flight secondary ion mass spectrometer operating with pulsed 25-keV Bi<sup>+</sup> ions for analysis and 2-keV Cs<sup>+</sup> ions for sputter ion-beam etching was employed for studying the near-surface composition of iron-nickel (permalloy) contacts (blades) after the treatment in pulsed nitrogen plasma directly in hermetically sealed reed switches. The formation of 20- to 25-nm thick oxynitride coatings in the contacting region of the blades was observed. It was found that this coating was of the diffusive nature and produced via the plasma nitriding of the contacts.</p>