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| Naji, M. |
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| Motta, Antonella |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Petrov, R. H. | Madrid |
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| Casati, R. |
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| Kočí, Jan | Prague |
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| Azevedo, Nuno Monteiro |
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Kamińska, Eliana
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Publications (4/4 displayed)
- 2012Continuous wavelet transform for d-space distribution analysis in nanocrystallic materialscitations
- 2012From porous to dense thin ZnO films through reactive DC sputter deposition onto Si (100) substratescitations
- 2009Stability of gold bonding and Ti/Au ohmic contact metallization to n-SiC in high power devicescitations
- 2008Application of ZnO to passivate the GaN-based device structures
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document
Continuous wavelet transform for d-space distribution analysis in nanocrystallic materials
Abstract
We present a novel application of the continuous wavelet transform (CWT) for quantitative analysis of electron diffraction fringe patterns for material science research. With this method unsupervised analysis of large data sets can be performed, to determine statistical distribution of fringe periods, corresponding to the spacing between the planes in the atomic lattice. It is more robust and less time consuming than typical manual approach. Obtained information can be further utilized for characterization and identification of the crystallographic structures present in the sample. The proposed method is applied to analysis of high resolution transmission electron microscope (HRTEM) images of Iridium-Zinc-Silicon-Oxide thin films, which reveal nanocrystallic structures dispersed in an amorphous matrix....