| People | Locations | Statistics |
|---|---|---|
| Naji, M. |
| |
| Motta, Antonella |
| |
| Aletan, Dirar |
| |
| Mohamed, Tarek |
| |
| Ertürk, Emre |
| |
| Taccardi, Nicola |
| |
| Kononenko, Denys |
| |
| Petrov, R. H. | Madrid |
|
| Alshaaer, Mazen | Brussels |
|
| Bih, L. |
| |
| Casati, R. |
| |
| Muller, Hermance |
| |
| Kočí, Jan | Prague |
|
| Šuljagić, Marija |
| |
| Kalteremidou, Kalliopi-Artemi | Brussels |
|
| Azam, Siraj |
| |
| Ospanova, Alyiya |
| |
| Blanpain, Bart |
| |
| Ali, M. A. |
| |
| Popa, V. |
| |
| Rančić, M. |
| |
| Ollier, Nadège |
| |
| Azevedo, Nuno Monteiro |
| |
| Landes, Michael |
| |
| Rignanese, Gian-Marco |
|
Grochowski, Jakub
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (1/1 displayed)
Places of action
| Organizations | Location | People |
|---|
document
Continuous wavelet transform for d-space distribution analysis in nanocrystallic materials
Abstract
We present a novel application of the continuous wavelet transform (CWT) for quantitative analysis of electron diffraction fringe patterns for material science research. With this method unsupervised analysis of large data sets can be performed, to determine statistical distribution of fringe periods, corresponding to the spacing between the planes in the atomic lattice. It is more robust and less time consuming than typical manual approach. Obtained information can be further utilized for characterization and identification of the crystallographic structures present in the sample. The proposed method is applied to analysis of high resolution transmission electron microscope (HRTEM) images of Iridium-Zinc-Silicon-Oxide thin films, which reveal nanocrystallic structures dispersed in an amorphous matrix....