Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 2012Characterization of orthogonal transfer array CCDs for the WIYN one degree imager2citations

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Chart of shared publication
Jacoby, George
1 / 1 shared
Harbeck, Daniel
1 / 1 shared
Cavin, John
1 / 3 shared
Bredthauer, Richard
1 / 1 shared
Sawyer, David
1 / 1 shared
Boggs, Kasey
1 / 1 shared
Ouellette, David
1 / 1 shared
Boroson, Todd
1 / 1 shared
Lesser, Michael
1 / 1 shared
Chart of publication period
2012

Co-Authors (by relevance)

  • Jacoby, George
  • Harbeck, Daniel
  • Cavin, John
  • Bredthauer, Richard
  • Sawyer, David
  • Boggs, Kasey
  • Ouellette, David
  • Boroson, Todd
  • Lesser, Michael
OrganizationsLocationPeople

document

Characterization of orthogonal transfer array CCDs for the WIYN one degree imager

  • Jacoby, George
  • Harbeck, Daniel
  • Cavin, John
  • Martin, Pierre
  • Bredthauer, Richard
  • Sawyer, David
  • Boggs, Kasey
  • Ouellette, David
  • Boroson, Todd
  • Lesser, Michael
Abstract

The WIYN One Degree Imager (ODI) will provide a one degree field of view for the WIYN 3.5 m telescope located on Kitt Peak near Tucson, Arizona. Its focal plane consists of an 8x8 grid of Orthogonal Transfer Array (OTA) CCD detectors. These detectors are the STA2200 OTA CCDs designed and fabricated by Semiconductor Technology Associates, Inc. and backside processed at the University of Arizona Imaging Technology Laboratory. Several lot runs of the STA2200 detectors have been fabricated. We have backside processed devices from these different lots and provide detector performance characterization, including noise, CTE, cosmetics, quantum efficiency, and some orthogonal transfer characteristics. We discuss the performance differences for the devices with different silicon thickness and resistivity. A fully buttable custom detector package has been developed for this project which allows hybridization of the silicon detectors directly onto an aluminum nitride substrate with an embedded pin grid array. This package is mounted on a silicon-aluminum alloy which provides a flat imaging surface of less than 20 microns peakvalley at the -100 C operating temperature. Characterization of the package performance, including low temperature profilometry, is described in this paper....

Topics
  • impedance spectroscopy
  • surface
  • resistivity
  • aluminium
  • semiconductor
  • laser emission spectroscopy
  • nitride
  • Silicon
  • profilometry