Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 2009Enabling deposition of hard x-ray reflective coatings as an industrial manufacturing process2citations

Places of action

Chart of shared publication
Boscolo Marchi, Enrico
1 / 1 shared
Spiga, Daniele
1 / 9 shared
Bertoli, Juri
1 / 1 shared
Mattarello, Valentina
1 / 2 shared
Kools, Jacques
1 / 1 shared
Salmaso, Guido
1 / 1 shared
Garoli, Denis
1 / 10 shared
Pareschi, Giovanni
1 / 28 shared
Chart of publication period
2009

Co-Authors (by relevance)

  • Boscolo Marchi, Enrico
  • Spiga, Daniele
  • Bertoli, Juri
  • Mattarello, Valentina
  • Kools, Jacques
  • Salmaso, Guido
  • Garoli, Denis
  • Pareschi, Giovanni
OrganizationsLocationPeople

article

Enabling deposition of hard x-ray reflective coatings as an industrial manufacturing process

  • Boscolo Marchi, Enrico
  • Spiga, Daniele
  • Bertoli, Juri
  • Mattarello, Valentina
  • Kools, Jacques
  • Salmaso, Guido
  • Garoli, Denis
  • Tagliaferri, Giampiero
  • Pareschi, Giovanni
Abstract

Depth-graded multilayer structures are widely considered as the preferred technology for the next generation of hard Xray telescopes operating in the spectral range up to several tens of keV. This contrasts to earlier generation telescopes which operated in the 1-10 keV range, and utilized single material reflection layers (e.g. Au). Several future space missions are scheduled to include optics comprising up to hundreds of nested shells with Wolter-I profile. Therefore, the need for an industrial strength (in terms of robustness, reliability and precision) manufacturing process for such multilayers has emerged. In this paper, we will discuss the enabling technologies towards "industrial" Physical Vapor Deposition (PVD) technology we have developed for this precision coating process. More specifically, we will review the results obtained on periodic and a-periodic W/Si multilayers, which have been produced on shells of 600 mm height and 300 mm diameter. Points that will be discussed include: Â. Advanced process control based on in-situ sensors and its effect on repeatability and stability of the process. Â. Ex-situ metrology methods Â. Thickness homogeneity over large areas

Topics
  • physical vapor deposition
  • strength