| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Sironi, Giorgia
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (13/13 displayed)
- 2017Design and development of the multilayer optics for the new hard x-ray missioncitations
- 2015An overview on mirrors for Cherenkov telescopes manufactured by glass cold-shaping technologycitations
- 2014Evaluation of the surface strength of glass plates shaped by hot slumping processcitations
- 2013Accurate integration of segmented x-ray optics using interfacing ribscitations
- 2011Technologies for manufacturing of high angular resolution multilayer coated optics for the New Hard X-ray Missioncitations
- 2010The optics system of the New Hard X-ray Mission: design and developmentcitations
- 2010Thin gold layer in NiCo and Ni electroforming process: optical surface characterizationcitations
- 2010Technologies for manufacturing of high angular resolution multilayer coated optics for the New Hard X-ray Mission: a status report IIcitations
- 2009Design and development of the optics system for the NHXM Hard X-ray and Polarimetric Missioncitations
- 2009Thin gold layer in Ni electroforming process: optical surface characterizationcitations
- 2008Mandrels manufacturing processes for Ni electroformed X-ray optics: profile errors contribution to imaging degradationcitations
- 2008Surface roughness evaluation on mandrels and mirror shells for future X-ray telescopescitations
- 2007Characterization of thin plastic foils for applications in x-ray optics technology
Places of action
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document
Mandrels manufacturing processes for Ni electroformed X-ray optics: profile errors contribution to imaging degradation
Abstract
It is well known that slope errors introduced by warped profiles in X-ray Wolter-I astronomical mirrors are important for the image quality at the focal plane. At this regard, a study aiming at developing reliable methods to predict the image quality on the basis of measured profiles of mandrels and mirror shells replicated by Ni electroforming has been performed. We are interested in determinating which of the different available methods could be trusted. The image quality is studied in terms of the Half Energy Width (HEW), a parameter in principle predictable from the metrological data. Two main approaches have been employed to calculate the HEW: i) ray-tracing, that follows the path of every generated photon from the source to the focus after the reflection onto a surface generated by the measured profiles; ii) the so called δ50 (delta 50) method, i.e. considering the slope errors distribution coming from the difference between Wolter profile and measured profile. The analysis is performed by means of software packages specifically written for this aim. They allowed us to consider 2D longitudinal profiles or a 3D grid composed of longitudinal and azimuthal profiles. Analysed profiles belong to mandrels and mirror-shells developed during the feasibility studies of the SIMBOLX and eRosita missions. The data were taken by means of profilometers during the several phases of their manufacturing. Monitoring the HEW evolution was investigated also in order to understand possible errors introduced during the replica and integration process, and to understand effects visible in focal spot and PSF's at the best focus or at different sections along the optical axis....