Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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1.080 Topics available

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977 Locations available

693.932 PEOPLE
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Naji, M.
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Sironi, Giorgia

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (13/13 displayed)

  • 2017Design and development of the multilayer optics for the new hard x-ray mission3citations
  • 2015An overview on mirrors for Cherenkov telescopes manufactured by glass cold-shaping technology5citations
  • 2014Evaluation of the surface strength of glass plates shaped by hot slumping process5citations
  • 2013Accurate integration of segmented x-ray optics using interfacing ribs22citations
  • 2011Technologies for manufacturing of high angular resolution multilayer coated optics for the New Hard X-ray Mission4citations
  • 2010The optics system of the New Hard X-ray Mission: design and development4citations
  • 2010Thin gold layer in NiCo and Ni electroforming process: optical surface characterization8citations
  • 2010Technologies for manufacturing of high angular resolution multilayer coated optics for the New Hard X-ray Mission: a status report II1citations
  • 2009Design and development of the optics system for the NHXM Hard X-ray and Polarimetric Mission16citations
  • 2009Thin gold layer in Ni electroforming process: optical surface characterization4citations
  • 2008Mandrels manufacturing processes for Ni electroformed X-ray optics: profile errors contribution to imaging degradation2citations
  • 2008Surface roughness evaluation on mandrels and mirror shells for future X-ray telescopes1citations
  • 2007Characterization of thin plastic foils for applications in x-ray optics technologycitations

Places of action

Chart of shared publication
Negri, B.
4 / 6 shared
Gorenstein, P.
1 / 4 shared
Attinà, P.
1 / 2 shared
Martelli, F.
1 / 6 shared
Romaine, S.
1 / 4 shared
Borghi, G.
4 / 6 shared
Citterio, O.
3 / 17 shared
Binda, R.
3 / 3 shared
Civitani, M.
1 / 3 shared
Cotroneo, V.
1 / 4 shared
Pareschi, G.
5 / 21 shared
Tagliaferri, G.
3 / 8 shared
Vernani, D.
3 / 8 shared
Parodi, Giancarlo
4 / 8 shared
Valsecchi, G.
3 / 12 shared
Basso, S.
3 / 10 shared
Raimondi, L.
3 / 10 shared
Spiga, D.
6 / 19 shared
Orlandi, A.
4 / 8 shared
Canestrari, Rodolfo
1 / 7 shared
Ghigo, Mauro
2 / 14 shared
Salmaso, Bianca
2 / 6 shared
Basso, Stefano
4 / 13 shared
Wille, Eric
2 / 6 shared
Silvestri, Mirko
1 / 1 shared
Borsa, Francesco
1 / 1 shared
Martelli, Francesco
3 / 4 shared
Proserpio, Laura
2 / 4 shared
Bavdaz, Marcos
2 / 5 shared
Spiga, Daniele
4 / 9 shared
Deste, Alberto
1 / 1 shared
Tagliaferri, Gianpiero
4 / 6 shared
Dalligna, Roberto
1 / 1 shared
Citterio, Oberto
4 / 10 shared
Civitani, Marta
3 / 6 shared
Pareschi, Giovanni
5 / 28 shared
Conconi, Paolo
1 / 1 shared
Civitani, Marta Maria
1 / 1 shared
Zambra, Alberto
1 / 1 shared
Gallieni, Daniele
1 / 2 shared
Tintori, Matteo
1 / 1 shared
Fumi, Pierluigi
1 / 1 shared
Salmaso, B.
1 / 5 shared
Grisoni, G.
2 / 5 shared
Kools, J.
2 / 3 shared
Missaglia, N.
3 / 3 shared
Marioni, F.
2 / 3 shared
Negri, R.
1 / 1 shared
Subranni, R.
1 / 1 shared
Ritucci, A.
2 / 4 shared
Valsecchi, Giuseppe
2 / 6 shared
Borghi, Giuseppe
2 / 2 shared
Raimondi, Lorenzo
1 / 2 shared
Vernani, Dervis
2 / 5 shared
Negri, Barbara
2 / 5 shared
Cotroneo, Vincenzo
2 / 10 shared
Orlandi, Alessandro
1 / 1 shared
Gorenstein, Paul
1 / 3 shared
Attinà, Primo
2 / 3 shared
Romaine, Suzanne
1 / 1 shared
Binda, Riccardo
1 / 1 shared
Paganini, L.
1 / 1 shared
Schnopper, Herbert W.
1 / 1 shared
Taibi, Angelo
1 / 1 shared
Barbera, Marco
1 / 7 shared
Valtolina, Renzo
1 / 1 shared
Chart of publication period
2017
2015
2014
2013
2011
2010
2009
2008
2007

Co-Authors (by relevance)

  • Negri, B.
  • Gorenstein, P.
  • Attinà, P.
  • Martelli, F.
  • Romaine, S.
  • Borghi, G.
  • Citterio, O.
  • Binda, R.
  • Civitani, M.
  • Cotroneo, V.
  • Pareschi, G.
  • Tagliaferri, G.
  • Vernani, D.
  • Parodi, Giancarlo
  • Valsecchi, G.
  • Basso, S.
  • Raimondi, L.
  • Spiga, D.
  • Orlandi, A.
  • Canestrari, Rodolfo
  • Ghigo, Mauro
  • Salmaso, Bianca
  • Basso, Stefano
  • Wille, Eric
  • Silvestri, Mirko
  • Borsa, Francesco
  • Martelli, Francesco
  • Proserpio, Laura
  • Bavdaz, Marcos
  • Spiga, Daniele
  • Deste, Alberto
  • Tagliaferri, Gianpiero
  • Dalligna, Roberto
  • Citterio, Oberto
  • Civitani, Marta
  • Pareschi, Giovanni
  • Conconi, Paolo
  • Civitani, Marta Maria
  • Zambra, Alberto
  • Gallieni, Daniele
  • Tintori, Matteo
  • Fumi, Pierluigi
  • Salmaso, B.
  • Grisoni, G.
  • Kools, J.
  • Missaglia, N.
  • Marioni, F.
  • Negri, R.
  • Subranni, R.
  • Ritucci, A.
  • Valsecchi, Giuseppe
  • Borghi, Giuseppe
  • Raimondi, Lorenzo
  • Vernani, Dervis
  • Negri, Barbara
  • Cotroneo, Vincenzo
  • Orlandi, Alessandro
  • Gorenstein, Paul
  • Attinà, Primo
  • Romaine, Suzanne
  • Binda, Riccardo
  • Paganini, L.
  • Schnopper, Herbert W.
  • Taibi, Angelo
  • Barbera, Marco
  • Valtolina, Renzo
OrganizationsLocationPeople

document

Surface roughness evaluation on mandrels and mirror shells for future X-ray telescopes

  • Sironi, Giorgia
  • Spiga, D.
Abstract

More X-ray missions that will be operating in near future, like particular SIMBOL-X, e-Rosita, Con-X/HXT, SVOM/XIAO and Polar-X, will be based on focusing optics manufactured by means of the Ni electroforming replication technique. This production method has already been successfully exploited for SAX, XMM and Swift-XRT. Optical surfaces for X-ray reflection have to be as smooth as possible also at high spatial frequencies. Hence it will be crucial to take under control microroughness in order to reduce the scattering effects. A high rms microroughness would cause the degradation of the angular resolution and loss of effective area. Stringent requirements have therefore to be fixed for mirror shells surface roughness depending on the specific energy range investigated, and roughness evolution has to be carefully monitored during the subsequent steps of the mirror-shells realization. This means to study the roughness evolution in the chain mandrel, mirror shells, multilayer deposition and also the degradation of mandrel roughness following iterated replicas. Such a study allows inferring which phases of production are the major responsible of the roughness growth and could help to find solutions optimizing the involved processes. The exposed study is carried out in the context of the technological consolidation related to SIMBOL-X, along with a systematic metrological study of mandrels and mirror shells. To monitor the roughness increase following each replica, a multiinstrumental approach was adopted: microprofiles were analysed by means of their Power Spectral Density (PSD) in the spatial frequency range 1000-0.01 μm. This enables the direct comparison of roughness data taken with instruments characterized by different operative ranges of frequencies, and in particular optical interferometers and Atomic Force Microscopes. The performed analysis allowed us to set realistic specifications on the mandrel roughness to be achieved, and to suggest a limit for the maximum number of a replica a mandrel can undergo before being refurbished....

Topics
  • Deposition
  • density
  • impedance spectroscopy
  • surface
  • phase
  • x-ray topography