Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (2/2 displayed)

  • 2008Quantitative measurement of laminar material properties and structure using time domain reflection imaging8citations
  • 2007Terahertz measurement and imaging detection of delamination and water intrusion in ground based radome panels2citations

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Chart of shared publication
Zimdars, David
2 / 6 shared
Chernovsky, A.
2 / 2 shared
White, Jeffrey S.
2 / 2 shared
Williamson, S.
2 / 4 shared
Megdanoff, C.
1 / 1 shared
Sucha, Gregg
1 / 1 shared
Stuk, G.
1 / 1 shared
Chart of publication period
2008
2007

Co-Authors (by relevance)

  • Zimdars, David
  • Chernovsky, A.
  • White, Jeffrey S.
  • Williamson, S.
  • Megdanoff, C.
  • Sucha, Gregg
  • Stuk, G.
OrganizationsLocationPeople

document

Quantitative measurement of laminar material properties and structure using time domain reflection imaging

  • Zimdars, David
  • Chernovsky, A.
  • White, Jeffrey S.
  • Fichter, G.
  • Williamson, S.
Abstract

Time domain terahertz (TD-THz) reflection imaging tomography can be used to investigate the laminar structure of objects. In a monostatic configuration, a sequence of pulses is generated by reflection from each discontinuity in index of refraction. Through analysis of the return pulses, the material absorption and index of refraction properties of each layer can be determined. TD-THz reflection tomography can be used to precisely measure the thickness of coatings such as yttria stabilized zirconia (YSZ) thermal barrier coatings (TBC) on aircraft engine turbine blades; paint on aircraft, ships, and cars; and other thin film measurement applications. In each of these cases, precise determination of the optical delay of the TD-THz pulses is required with as little as sub-10 femtosecond precision for pulses which can be greater than 500 fs in duration. We present a method to accurately measure optical delay between layers where the pulses are fit to a reference template. These are demonstrated to achieve micron scale accuracy in coating thickness. As an example, TD-THz non destructive evaluation (NDE) imaging is used to two-dimensionally map the thickness of YSZ TBCs on aircraft engine turbine blades. Indications of thermal degradation can be seen. The method is non-contact, rapid, and requires no special preparation of the blade.

Topics
  • impedance spectroscopy
  • thin film
  • tomography
  • index of refraction