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Naji, M. |
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Motta, Antonella |
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Aletan, Dirar |
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Mohamed, Tarek |
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Ertürk, Emre |
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Taccardi, Nicola |
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Kononenko, Denys |
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Petrov, R. H. | Madrid |
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Alshaaer, Mazen | Brussels |
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Bih, L. |
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Casati, R. |
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Muller, Hermance |
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Kočí, Jan | Prague |
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Šuljagić, Marija |
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Kalteremidou, Kalliopi-Artemi | Brussels |
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Azam, Siraj |
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Ospanova, Alyiya |
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Blanpain, Bart |
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Ali, M. A. |
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Popa, V. |
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Rančić, M. |
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Ollier, Nadège |
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Azevedo, Nuno Monteiro |
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Landes, Michael |
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Rignanese, Gian-Marco |
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Cuenot, Stéphane
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (12/12 displayed)
- 2022Interactions between infernan and calcium: From the molecular level to the mechanical properties of microgelscitations
- 2022Mechanical relaxations of hydrogels governed by their physical or chemical crosslinkscitations
- 2022Mechanical relaxations of hydrogels governed by their physical or chemical crosslinkscitations
- 2010Variation of Elastic Properties of Responsive Polymer Nanotubescitations
- 2006First insights into electrografted polymers by AFM-based force spectroscopycitations
- 2005Elastic modulus of nanomaterials: resonant contact-AFM measurement and reduced-size effects (invited lecture)citations
- 2004Surface tension effect on the mechanical properties of nanomaterials measured by atomic force microscopycitations
- 2003Physical properties of conducting polymer nanofiberscitations
- 2003Measurement of elastic modulus of nanotubes by resonant contact atomic force microscopycitations
- 2003Spinodal-like dewetting of thermodynamically-stable thin polymer films.citations
- 2003Size effect on the elastic modulus of nanomaterials as measured by resonant contact atomic force microscopy
- 2000Elastic modulus of polypyrrole nanotubescitations
Places of action
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document
Elastic modulus of nanomaterials: resonant contact-AFM measurement and reduced-size effects (invited lecture)
Abstract
Resonant contact atomic force microscopy (resonant C-AFM) is used to quantitatively measure the elastic modulus of polymer nanotubes and metallic nanowires. To achieve this, an oscillating electric field is applied between the sample holder and the microscope head to excite the oscillation of the cantilever in contact with the nanostructures suspended over the pores of a membrane. The resonance frequency of the cantilever with the tip in contact with a nanostructure is shifted to higher values with respect to the resonance frequency of the free cantilever. It is demonstrated that the system can simply be modeled by a cantilever with the tip in contact with two springs. The measurement of the frequency shift enables the direct determination of the spring stiffness, i.e. the nanowires or nanotube stiffness. The method also enables the determination of the boundary conditions of the nanobeam on the membrane. The tensile elastic modulus is then simply determined using the classical theory of beam deflection. The obtained results for the larger nanostructures fairly agree to the values reported in the literature for the macroscopic elastic modulus of the corresponding materials. The measured modulus of the nanomaterials with smaller diameters is significantly higher than that of the larger ones. The increase of the apparent elastic modulus for the smaller diameters is attributed to the surface tension effects. It is thus demonstrated that resonant C-AFM enables the measurement of the elastic modulus and of the surface tension of nanomaterials.