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Jacob, M. V.
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Topics
Publications (10/10 displayed)
- 2008Microwave Characterisation of MgTe2O5 using quasi TE0np Mode Dielectric Resonator Technique
- 2008Bi-2(Zn2/3-x/3Nb4/3-2x/3Tix)O-7 Ceramics - A High Permittivity Microwave Dielectrics for Electronics Application
- 2007Non-destructive complex permittivity measurement of low permittivity thin film materialscitations
- 2006Cryogenic complex anisotropic permittivity of magnesium fluoridecitations
- 2006Dielectric characterisation of Barium Fluoride at cryogenic temperatures using TE011 and quasi TE0mn mode dielectric resonatorscitations
- 2005Low temperature complex permittivity of MgF/sub 2/ at microwave frequencies from TE/sub 01/spl delta// modescitations
- 2004Recent advances in measurements of permittivity and dielectric losses at microwave frequenciescitations
- 2004Microwave characterization of (La,Sr)(AlTa)O3 using TE011 mode dielectric resonator
- 2003Lithium tantalate - a high permittivity dielectric material for microwave communication systemscitations
- 2003Microwave characterisation of CaF2 at cryogenic temperatures using a dielectric resonator techniquecitations
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document
Recent advances in measurements of permittivity and dielectric losses at microwave frequencies
Abstract
<p>The precise microwave characterization of dielectric materials is an important issue for emerging technologies of the 21<sup>st</sup> century. In this paper recent advances in resonant techniques for permittivity and dielectric loss tangent measurements of low and medium loss dielectrics at microwave frequencies are presented.</p>