Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (2/2 displayed)

  • 2022Flight-like critical-angle transmission grating x-ray performance for Arcus4citations
  • 2018Blazed transmission grating technology development for the Arcus x-ray spectrometer explorer12citations

Places of action

Chart of shared publication
Langmeier, Andreas
1 / 1 shared
Günther, Hans Moritz
1 / 1 shared
Schmidt, Thomas
1 / 21 shared
Bruccoleri, Alexander R.
2 / 2 shared
Garner, Alan
1 / 1 shared
Cheimets, Peter
1 / 2 shared
Mueller, Thomas
1 / 5 shared
Burwitz, Vadim
2 / 7 shared
Schattenburg, Mark L.
2 / 2 shared
Gullikson, Eric M.
2 / 2 shared
Heilmann, Ralf K.
2 / 3 shared
Rukdee, Surangkhana
1 / 1 shared
Hertz, Edward
2 / 2 shared
Smith, Randall K.
2 / 2 shared
Deroo, Casey
2 / 3 shared
Pelliciari, Carlo
1 / 1 shared
Marshall, Herman L.
1 / 4 shared
Lamarr, Beverly
1 / 1 shared
Heine, Sarah N. T.
1 / 1 shared
Guenther, Hans M.
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Schulz, Norbert S.
1 / 1 shared
Song, Jungki
1 / 1 shared
Cheimetz, Peter
1 / 1 shared
La Caria, Marlis-Madeleine
1 / 1 shared
Chart of publication period
2022
2018

Co-Authors (by relevance)

  • Langmeier, Andreas
  • Günther, Hans Moritz
  • Schmidt, Thomas
  • Bruccoleri, Alexander R.
  • Garner, Alan
  • Cheimets, Peter
  • Mueller, Thomas
  • Burwitz, Vadim
  • Schattenburg, Mark L.
  • Gullikson, Eric M.
  • Heilmann, Ralf K.
  • Rukdee, Surangkhana
  • Hertz, Edward
  • Smith, Randall K.
  • Deroo, Casey
  • Pelliciari, Carlo
  • Marshall, Herman L.
  • Lamarr, Beverly
  • Heine, Sarah N. T.
  • Guenther, Hans M.
  • Schulz, Norbert S.
  • Song, Jungki
  • Cheimetz, Peter
  • La Caria, Marlis-Madeleine
OrganizationsLocationPeople

document

Flight-like critical-angle transmission grating x-ray performance for Arcus

  • Langmeier, Andreas
  • Günther, Hans Moritz
  • Schmidt, Thomas
  • Bruccoleri, Alexander R.
  • Garner, Alan
  • Cheimets, Peter
  • Mueller, Thomas
  • Burwitz, Vadim
  • Schattenburg, Mark L.
  • Gullikson, Eric M.
  • Heilmann, Ralf K.
  • Rukdee, Surangkhana
  • Hertz, Edward
  • Smith, Randall K.
  • Hartner, Gisela
  • Deroo, Casey
Abstract

High resolving power soft x-ray spectroscopy has been confirmed by the recent Astro2020 Decadal Survey as a high-priority strategic goal with R =λ/Δλ as high as 7500 for some science cases. Examples are the characterization of highly ionized gases in galaxy halos and within and around galaxy clusters, accretion onto supermassive black holes, coronal mass ejections and coronal heating. Below the level of an expensive strategic mission, but far exceeding current capabilities, falls the Arcus Grating Explorer mission concept, with a minimum R of 2500 (expected R = 3500) and effective area up to ∼ 300 cm<SUP>2</SUP> in the 12-50 Å bandpass. Arcus relies on light-weight, high-efficiency, blazed and alignment-insensitive critical-angle transmission (CAT) gratings for dispersion. The mission calls for hundreds of ∼ 30×30 mm<SUP>2</SUP> gratings with a hierarchy of integrated support structures. The most recent CAT gratings have been fabricated from 200 mm silicon-on-insulator wafers using commercial, volume production compatible tools from the semiconductor and MEMS industries. We report x-ray results from quasifully illuminated, co-aligned CAT gratings showing record-high R ∼ 1.3×10<SUP>4 </SUP>in 18th order at Al-K<SUB>α</SUB> wavelengths, and diffraction efficiency of blazed orders in agreement with pencil beam synchrotron measurements and model predictions at O-K. Tilt of the deep-etched, freestanding grating bars relative to the grating surface is measured and successfully compensated through angular alignment during bonding of the Si gratings to metal frames. We also report on updates to the Arcus resolving power error budget, and on post-fabrication thinning of grating bars, which could lead to increased diffraction efficiency....

Topics
  • impedance spectroscopy
  • dispersion
  • surface
  • cluster
  • semiconductor
  • Silicon
  • X-ray spectroscopy
  • aligned