Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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Technical University of Denmark

in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (2/2 displayed)

  • 2021The effect of deposition process parameters on thin film coatings for the Athena X-ray optics14citations
  • 2021Commissioning and qualification of the Low-Energy X-ray Reectometer and its utilization in development of X-ray mirror coatings for astronomical instrumentationcitations

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Chart of shared publication
Collon, M.
1 / 2 shared
Christensen, Finn Erland
1 / 8 shared
Ferreira, I.
1 / 8 shared
Schönberger, W.
1 / 6 shared
Landgraf, B.
1 / 2 shared
Svendsen, Sara
1 / 5 shared
Arne, S. Jegers
1 / 2 shared
Girou, D.
1 / 2 shared
Gellert, Nis Christian
1 / 2 shared
Shortt, B.
1 / 2 shared
Ferreira, Desiree Della Monica
1 / 5 shared
Thete, A.
1 / 2 shared
Bavdaz, M.
1 / 3 shared
Langer, A.
1 / 2 shared
Chart of publication period
2021

Co-Authors (by relevance)

  • Collon, M.
  • Christensen, Finn Erland
  • Ferreira, I.
  • Schönberger, W.
  • Landgraf, B.
  • Svendsen, Sara
  • Arne, S. Jegers
  • Girou, D.
  • Gellert, Nis Christian
  • Shortt, B.
  • Ferreira, Desiree Della Monica
  • Thete, A.
  • Bavdaz, M.
  • Langer, A.
OrganizationsLocationPeople

document

The effect of deposition process parameters on thin film coatings for the Athena X-ray optics

  • Collon, M.
  • Christensen, Finn Erland
  • Ferreira, I.
  • Schönberger, W.
  • Landgraf, B.
  • Svendsen, Sara
  • Henriksen, Peter Lindquist
  • Arne, S. Jegers
  • Girou, D.
  • Gellert, Nis Christian
  • Shortt, B.
  • Ferreira, Desiree Della Monica
  • Thete, A.
  • Bavdaz, M.
  • Langer, A.
Abstract

<p>The thin film coating technology for the European Space Agency mission, Advanced Telescope for High-Energy Astrophysics (Athena) has been established. The X-ray optics of the Athena telescope is based on Silicon Pore Optics (SPO) technology which is enhanced by the thin film coatings deposited on the reflective surface of the SPO plates. In this work, we present a literature study of the coating process parameter space and provide an overview of the thin film properties with a focus on micro roughness, chemical composition and wear resistance when deposited under various process conditions. We determined, that the thin film density depends strongly on the mobility of the adatoms on the substrate surface. Some coating process parameters, which have a significant impact on the adatom mobility are the discharge voltage, the working gas pressure and the substrate temperature.</p>

Topics
  • Deposition
  • density
  • impedance spectroscopy
  • pore
  • surface
  • mobility
  • thin film
  • wear resistance
  • chemical composition
  • Silicon