Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (6/6 displayed)

  • 2021Defect identification in complex oxides: Positron annihilation spectroscopy of β-Ga₂O₃ and SrTiO₃ ; Rakennevirheiden tunnistus monimutkaisissa puolijohdemateriaaleissa: positroniannihilaatiospektroskopia β-Ga₂O₃:ssa ja SrTiO₃:ssa47citations
  • 2021Defect identification in complex oxides: Positron annihilation spectroscopy of β-Ga₂O₃ and SrTiO₃citations
  • 2020Ti-Sr antisite12citations
  • 2020Ti-Sr antisite : An abundant point defect in SrTiO312citations
  • 2019Ga vacancies and electrical compensation in beta-Ga2O3 thin films studied with positron annihilation spectroscopy14citations
  • 2019Ga vacancies and electrical compensation in β-Ga 2 O 3 thin films studied with positron annihilation spectroscopy14citations

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Makkonen, Ilja
4 / 16 shared
Prozheeva, Vera
4 / 5 shared
Bickermann, Matthias
2 / 6 shared
Guguschev, Christo
2 / 3 shared
Tuomisto, Filip
4 / 44 shared
Markurt, Toni
2 / 5 shared
Wagner, Gunter
2 / 2 shared
Baldini, Michele
2 / 2 shared
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2020
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Co-Authors (by relevance)

  • Makkonen, Ilja
  • Prozheeva, Vera
  • Bickermann, Matthias
  • Guguschev, Christo
  • Tuomisto, Filip
  • Markurt, Toni
  • Wagner, Gunter
  • Baldini, Michele
OrganizationsLocationPeople

document

Ga vacancies and electrical compensation in beta-Ga2O3 thin films studied with positron annihilation spectroscopy

  • Makkonen, Ilja
  • Wagner, Gunter
  • Karjalainen, Antti
  • Prozheeva, Vera
  • Baldini, Michele
  • Tuomisto, Filip
Abstract

We have applied positron annihilation spectroscopy to study vacancy-type defects in unintentionally doped and Si and Sn doped beta-Ga2O(3) homoepitaxial thin films grown by metal-organic chemical vapor deposition (MOCVD). We detect Ga vacancy related defects at high concentrations in semi-insulating and highly resistive material, while conductive (n-type) material exhibits very low Ga vacancy concentrations. These findings show that Ga vacancies can act as efficient electrical compensators for n-type conductivity, but their concentrations can be suppressed by controlling the growth environment, leading to efficient n-type doping. We also note the strong anisotropy of the positron annihilation signals and give recommendation for presenting positron data obtained in beta-Ga2O3.

Topics
  • thin film
  • positron annihilation lifetime spectroscopy
  • chemical vapor deposition
  • vacancy