Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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1.080 Topics available

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977 Locations available

693.932 PEOPLE
693.932 People People

693.932 People

Show results for 693.932 people that are selected by your search filters.

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Naji, M.
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Poźniak, Krzysztof

  • Google
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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (18/18 displayed)

  • 2019Multichannel Data Acquisition System for GEM Detectors 12citations
  • 2018Advanced real-time data quality monitoring model for tokamak plasma diagnostics3citations
  • 2017FPGA-based firmware model for extended measurement systems with data quality monitoring 3citations
  • 2016 Modeling of serial data acquisition structure for GEM detector system in Matlab5citations
  • 2016New trends in logic synthesis for both digital designing and data processing 2citations
  • 2016The development of algorithms for the deployment of new version of GEM-detector-based acquisition system6citations
  • 2015Architecture of the Upgraded BCM1F backend Electronics for Beam Conditions and Luminosity Measurement4citations
  • 2015The CMS Fast Beams Condition Monitor Back-End Electronics based on MicroTCA technology – status and developmentcitations
  • 2015FPGA based charge acquisition algorithm for soft X-ray diagnostics system12citations
  • 2015Development of low noise CCD readout front-end 1citations
  • 2015OMTF firmware overview3citations
  • 2014Development of GEM Gas Detectors for X-Ray Crystal Spectrometry 53citations
  • 2014The Fast Beam Condition Monitor BCM1F Backend Electronics Upgraded MicroTCA Based Architecture4citations
  • 2013Fundamental Data Processing for GEM Detector Measurement System Applied for X - ray Diagnostics of Fusion Plasmascitations
  • 2011Optimization of FPGA processing of GEM detector signal 12citations
  • 2011Development of a 1D Triple GEM X-ray detector for a high-resolution x-ray diagnostics at JETcitations
  • 2005Optical network and FPGA/DSP based control system for free electon lasercitations
  • 2003Cavity Digital Control Testing System by Simulink Step Operation Method for TESLA Linear Accelerator and Free Electron Lasercitations

Places of action

Chart of shared publication
Krawczyk, Rafał
4 / 4 shared
Zabołotny, Wojciech
9 / 10 shared
Czarski, Tomasz
10 / 10 shared
Kolasiński, Piotr
4 / 4 shared
Chernyshova, M.
8 / 16 shared
Kasprowicz, Grzegorz Henryk
10 / 10 shared
Gąska, Michał
1 / 1 shared
Wojeński, Andrzej
6 / 6 shared
Linczuk, Paweł
2 / 2 shared
Mazon, Dider
1 / 1 shared
Mazon, D.
1 / 1 shared
Byszuk, Adrian
3 / 3 shared
Borowik, Grzegorz
1 / 3 shared
Łuba, Tadeusz
1 / 3 shared
Zienkiewicz, Paweł
2 / 2 shared
Czernyshova, Maryna
1 / 1 shared
Walsh, R.
1 / 3 shared
Lange, W.
1 / 2 shared
Przyborowski, D.
1 / 1 shared
Leonard, Jessica L.
1 / 1 shared
Dabrowski, A. E.
1 / 1 shared
Zagoździńska, Agnieszka
3 / 3 shared
Miraglia, M.
1 / 1 shared
Lohmann, W.
1 / 1 shared
Ryjov, V.
1 / 1 shared
Dabrowski, Anne E.
2 / 2 shared
Juszczyk, Bartłomiej
1 / 1 shared
Romaniuk, Ryszard S.
4 / 9 shared
Jamroży, Mikołaj
1 / 1 shared
Olszewski, Michał
1 / 1 shared
Skała, Aleksander
1 / 1 shared
Królikowski, Jan
1 / 1 shared
Okliński, W.
1 / 1 shared
Drabik, Paweł Krzysztof
1 / 1 shared
Kierzkowski, Krzysztof
2 / 2 shared
Doroba, Krzysztof
1 / 1 shared
Bluj, M.
1 / 1 shared
Bunkowski, Karol
1 / 1 shared
Konecki, M.
1 / 1 shared
Kalinowski, Artur
1 / 1 shared
Zawistowski, Krystian
1 / 1 shared
Dominik, Wojciech
2 / 2 shared
Jakubowska, Katarzyna L.
1 / 1 shared
Rzadkiewicz, Jacek
2 / 2 shared
Scholz, Marek
2 / 2 shared
Bell, Alan
1 / 1 shared
Dominik, W.
2 / 2 shared
Jakubowska, K.
2 / 2 shared
Ryszard, Dąbrowski
1 / 1 shared
Leslaw, Karpinski
1 / 1 shared
Katarzyna, Jakubowska
1 / 1 shared
Marek, Scholz
1 / 1 shared
Zbigniew, Sałapa
1 / 1 shared
Kudła, Ignacy Maciej
1 / 1 shared
Jacek, Rzadkiewicz
1 / 1 shared
Henryk, Czyrkowski
1 / 1 shared
Maryna, Chernyshova
1 / 1 shared
Komarzewski, A.
1 / 1 shared
Czyrkowski, H.
1 / 1 shared
Kierzkowski, K.
1 / 1 shared
Kudła, I. M.
1 / 1 shared
Dąbrowski, R.
1 / 1 shared
Rzadkiewicz, J.
1 / 1 shared
Karpiński, L.
1 / 1 shared
Tyrrell, S.
1 / 1 shared
Salapa, Z.
1 / 1 shared
Zastrow, K. D.
1 / 2 shared
Blanchard, P.
1 / 3 shared
Scholz, M.
1 / 5 shared
Giergusiewicz, Wojciech
1 / 1 shared
Koprek, Waldemar
1 / 2 shared
Czuba, Krzysztof Marek
1 / 4 shared
Simrock, Stefan
1 / 2 shared
Chart of publication period
2019
2018
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2011
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Co-Authors (by relevance)

  • Krawczyk, Rafał
  • Zabołotny, Wojciech
  • Czarski, Tomasz
  • Kolasiński, Piotr
  • Chernyshova, M.
  • Kasprowicz, Grzegorz Henryk
  • Gąska, Michał
  • Wojeński, Andrzej
  • Linczuk, Paweł
  • Mazon, Dider
  • Mazon, D.
  • Byszuk, Adrian
  • Borowik, Grzegorz
  • Łuba, Tadeusz
  • Zienkiewicz, Paweł
  • Czernyshova, Maryna
  • Walsh, R.
  • Lange, W.
  • Przyborowski, D.
  • Leonard, Jessica L.
  • Dabrowski, A. E.
  • Zagoździńska, Agnieszka
  • Miraglia, M.
  • Lohmann, W.
  • Ryjov, V.
  • Dabrowski, Anne E.
  • Juszczyk, Bartłomiej
  • Romaniuk, Ryszard S.
  • Jamroży, Mikołaj
  • Olszewski, Michał
  • Skała, Aleksander
  • Królikowski, Jan
  • Okliński, W.
  • Drabik, Paweł Krzysztof
  • Kierzkowski, Krzysztof
  • Doroba, Krzysztof
  • Bluj, M.
  • Bunkowski, Karol
  • Konecki, M.
  • Kalinowski, Artur
  • Zawistowski, Krystian
  • Dominik, Wojciech
  • Jakubowska, Katarzyna L.
  • Rzadkiewicz, Jacek
  • Scholz, Marek
  • Bell, Alan
  • Dominik, W.
  • Jakubowska, K.
  • Ryszard, Dąbrowski
  • Leslaw, Karpinski
  • Katarzyna, Jakubowska
  • Marek, Scholz
  • Zbigniew, Sałapa
  • Kudła, Ignacy Maciej
  • Jacek, Rzadkiewicz
  • Henryk, Czyrkowski
  • Maryna, Chernyshova
  • Komarzewski, A.
  • Czyrkowski, H.
  • Kierzkowski, K.
  • Kudła, I. M.
  • Dąbrowski, R.
  • Rzadkiewicz, J.
  • Karpiński, L.
  • Tyrrell, S.
  • Salapa, Z.
  • Zastrow, K. D.
  • Blanchard, P.
  • Scholz, M.
  • Giergusiewicz, Wojciech
  • Koprek, Waldemar
  • Czuba, Krzysztof Marek
  • Simrock, Stefan
OrganizationsLocationPeople

booksection

Advanced real-time data quality monitoring model for tokamak plasma diagnostics

  • Poźniak, Krzysztof
  • Chernyshova, M.
  • Mazon, Dider
  • Wojeński, Andrzej
Abstract

Modern physics experiments require construction of advanced, modular measurement systems for data processing and registration purposes. The most important systems are connected to the feedback loop in order to perform real-time experiment control. The paper is related to soft X-ray measurement systems working on tokamaks. As the sensor unit the GEM detector is considered. The hardware platform consists of analog and digital data path, with data preprocessing in FPGAs and real-time output products computation in embedded PC (CPU). The main focus in put on the importance of output products data quality from the measurement systems. In the paper is presented the model of the data evaluation and quality monitoring component for work in real-time. The typical hardware and data path structure is described, with analysis of the low-quality data propagation, in order to present the most optimal placement of the DQM data filtering structure. The DQM model is divided into the FPGA and CPU part. The model is based on iterative signal classification unit working in real-time. Additional sub-diagnostics allows recording and analysis of the events in term of raw data and statistical information. In a summary section the benefits from model implementation are described. The presented model is designed in universal, modular approach and can be applied to various measurement systems.

Topics
  • impedance spectroscopy
  • experiment