People | Locations | Statistics |
---|---|---|
Naji, M. |
| |
Motta, Antonella |
| |
Aletan, Dirar |
| |
Mohamed, Tarek |
| |
Ertürk, Emre |
| |
Taccardi, Nicola |
| |
Kononenko, Denys |
| |
Petrov, R. H. | Madrid |
|
Alshaaer, Mazen | Brussels |
|
Bih, L. |
| |
Casati, R. |
| |
Muller, Hermance |
| |
Kočí, Jan | Prague |
|
Šuljagić, Marija |
| |
Kalteremidou, Kalliopi-Artemi | Brussels |
|
Azam, Siraj |
| |
Ospanova, Alyiya |
| |
Blanpain, Bart |
| |
Ali, M. A. |
| |
Popa, V. |
| |
Rančić, M. |
| |
Ollier, Nadège |
| |
Azevedo, Nuno Monteiro |
| |
Landes, Michael |
| |
Rignanese, Gian-Marco |
|
Poźniak, Krzysztof
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (18/18 displayed)
- 2019Multichannel Data Acquisition System for GEM Detectors citations
- 2018Advanced real-time data quality monitoring model for tokamak plasma diagnosticscitations
- 2017FPGA-based firmware model for extended measurement systems with data quality monitoring citations
- 2016 Modeling of serial data acquisition structure for GEM detector system in Matlabcitations
- 2016New trends in logic synthesis for both digital designing and data processing citations
- 2016The development of algorithms for the deployment of new version of GEM-detector-based acquisition systemcitations
- 2015Architecture of the Upgraded BCM1F backend Electronics for Beam Conditions and Luminosity Measurementcitations
- 2015The CMS Fast Beams Condition Monitor Back-End Electronics based on MicroTCA technology – status and development
- 2015FPGA based charge acquisition algorithm for soft X-ray diagnostics systemcitations
- 2015Development of low noise CCD readout front-end citations
- 2015OMTF firmware overviewcitations
- 2014Development of GEM Gas Detectors for X-Ray Crystal Spectrometry citations
- 2014The Fast Beam Condition Monitor BCM1F Backend Electronics Upgraded MicroTCA Based Architecturecitations
- 2013Fundamental Data Processing for GEM Detector Measurement System Applied for X - ray Diagnostics of Fusion Plasmas
- 2011Optimization of FPGA processing of GEM detector signal citations
- 2011Development of a 1D Triple GEM X-ray detector for a high-resolution x-ray diagnostics at JET
- 2005Optical network and FPGA/DSP based control system for free electon laser
- 2003Cavity Digital Control Testing System by Simulink Step Operation Method for TESLA Linear Accelerator and Free Electron Laser
Places of action
Organizations | Location | People |
---|
booksection
Advanced real-time data quality monitoring model for tokamak plasma diagnostics
Abstract
Modern physics experiments require construction of advanced, modular measurement systems for data processing and registration purposes. The most important systems are connected to the feedback loop in order to perform real-time experiment control. The paper is related to soft X-ray measurement systems working on tokamaks. As the sensor unit the GEM detector is considered. The hardware platform consists of analog and digital data path, with data preprocessing in FPGAs and real-time output products computation in embedded PC (CPU). The main focus in put on the importance of output products data quality from the measurement systems. In the paper is presented the model of the data evaluation and quality monitoring component for work in real-time. The typical hardware and data path structure is described, with analysis of the low-quality data propagation, in order to present the most optimal placement of the DQM data filtering structure. The DQM model is divided into the FPGA and CPU part. The model is based on iterative signal classification unit working in real-time. Additional sub-diagnostics allows recording and analysis of the events in term of raw data and statistical information. In a summary section the benefits from model implementation are described. The presented model is designed in universal, modular approach and can be applied to various measurement systems.