Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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1.080 Topics available

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (6/6 displayed)

  • 2019Multichannel Data Acquisition System for GEM Detectors 12citations
  • 2018Advanced real-time data quality monitoring model for tokamak plasma diagnostics3citations
  • 2017FPGA-based firmware model for extended measurement systems with data quality monitoring 3citations
  • 2016 Modeling of serial data acquisition structure for GEM detector system in Matlab5citations
  • 2016The development of algorithms for the deployment of new version of GEM-detector-based acquisition system6citations
  • 2015FPGA based charge acquisition algorithm for soft X-ray diagnostics system12citations

Places of action

Chart of shared publication
Krawczyk, Rafał
4 / 4 shared
Zabołotny, Wojciech
4 / 10 shared
Czarski, Tomasz
4 / 10 shared
Poźniak, Krzysztof
6 / 18 shared
Kolasiński, Piotr
4 / 4 shared
Chernyshova, M.
5 / 16 shared
Kasprowicz, Grzegorz Henryk
4 / 10 shared
Gąska, Michał
1 / 1 shared
Linczuk, Paweł
2 / 2 shared
Mazon, Dider
1 / 1 shared
Mazon, D.
1 / 1 shared
Byszuk, Adrian
2 / 3 shared
Zienkiewicz, Paweł
2 / 2 shared
Czernyshova, Maryna
1 / 1 shared
Juszczyk, Bartłomiej
1 / 1 shared
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Co-Authors (by relevance)

  • Krawczyk, Rafał
  • Zabołotny, Wojciech
  • Czarski, Tomasz
  • Poźniak, Krzysztof
  • Kolasiński, Piotr
  • Chernyshova, M.
  • Kasprowicz, Grzegorz Henryk
  • Gąska, Michał
  • Linczuk, Paweł
  • Mazon, Dider
  • Mazon, D.
  • Byszuk, Adrian
  • Zienkiewicz, Paweł
  • Czernyshova, Maryna
  • Juszczyk, Bartłomiej
OrganizationsLocationPeople

booksection

Advanced real-time data quality monitoring model for tokamak plasma diagnostics

  • Poźniak, Krzysztof
  • Chernyshova, M.
  • Mazon, Dider
  • Wojeński, Andrzej
Abstract

Modern physics experiments require construction of advanced, modular measurement systems for data processing and registration purposes. The most important systems are connected to the feedback loop in order to perform real-time experiment control. The paper is related to soft X-ray measurement systems working on tokamaks. As the sensor unit the GEM detector is considered. The hardware platform consists of analog and digital data path, with data preprocessing in FPGAs and real-time output products computation in embedded PC (CPU). The main focus in put on the importance of output products data quality from the measurement systems. In the paper is presented the model of the data evaluation and quality monitoring component for work in real-time. The typical hardware and data path structure is described, with analysis of the low-quality data propagation, in order to present the most optimal placement of the DQM data filtering structure. The DQM model is divided into the FPGA and CPU part. The model is based on iterative signal classification unit working in real-time. Additional sub-diagnostics allows recording and analysis of the events in term of raw data and statistical information. In a summary section the benefits from model implementation are described. The presented model is designed in universal, modular approach and can be applied to various measurement systems.

Topics
  • impedance spectroscopy
  • experiment