Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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University of Southampton

in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (11/11 displayed)

  • 2020Silicon erasable waveguides and directional couplers by germanium ion implantation for configurable photonic circuits13citations
  • 2018Germanium implanted photonic devices for post-fabrication trimming and programmable circuits1citations
  • 2018Ion implantation in silicon for trimming the operating wavelength of ring resonators65citations
  • 2018Real-time monitoring and gradient feedback enable accurate trimming of ion-implanted silicon photonic devices24citations
  • 2017Towards autonomous testing of photonic integrated circuits1citations
  • 2017Phase trimming of Mach-Zehnder Interferometers by laser annealing of germanium implanted waveguides1citations
  • 2017Post-fabrication phase trimming of Mach-Zehnder Interferometers by laser annealing of germanium implanted waveguides36citations
  • 2017Trimming of ring resonators via ion implantation in silicon5citations
  • 2014Silicon-based photonic integration beyond the telecommunication wavelength range117citations
  • 2014Long-wavelength silicon photonic integrated circuitscitations
  • 2014Mid-IR heterogeneous silicon photonics8citations

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Chart of shared publication
Mailis, Sakellaris
1 / 7 shared
Reed, Graham
5 / 6 shared
Yu, Xingshi
3 / 3 shared
Saito, Shinichi
3 / 5 shared
Runge, Antoine
3 / 7 shared
Peacock, Anna C.
8 / 47 shared
Milošević, Milan
6 / 6 shared
Thomson, David
5 / 8 shared
Khokhar, Ali Z.
3 / 4 shared
Reed, Graham T.
2 / 5 shared
Thomson, David J.
2 / 4 shared
Chen, Bigeng
2 / 2 shared
Runge, Antoine F. J.
1 / 4 shared
Muskens, Otto
2 / 6 shared
Milošević, Milan M.
1 / 1 shared
Runge, A. F. J.
1 / 2 shared
Cao, Wei
2 / 12 shared
Thomson, D. J.
1 / 5 shared
Reed, G. T.
1 / 8 shared
Franz, Y.
1 / 4 shared
Milošević, M. M.
1 / 2 shared
Littlejohns, C. G.
1 / 3 shared
Khokhar, Ali
3 / 6 shared
Franz, Yohann
2 / 7 shared
Chart of publication period
2020
2018
2017
2014

Co-Authors (by relevance)

  • Mailis, Sakellaris
  • Reed, Graham
  • Yu, Xingshi
  • Saito, Shinichi
  • Runge, Antoine
  • Peacock, Anna C.
  • Milošević, Milan
  • Thomson, David
  • Khokhar, Ali Z.
  • Reed, Graham T.
  • Thomson, David J.
  • Chen, Bigeng
  • Runge, Antoine F. J.
  • Muskens, Otto
  • Milošević, Milan M.
  • Runge, A. F. J.
  • Cao, Wei
  • Thomson, D. J.
  • Reed, G. T.
  • Franz, Y.
  • Milošević, M. M.
  • Littlejohns, C. G.
  • Khokhar, Ali
  • Franz, Yohann
OrganizationsLocationPeople

document

Trimming of ring resonators via ion implantation in silicon

  • Reed, Graham
  • Chen, Xia
  • Milošević, Milan
  • Thomson, David
Abstract

Ion implantation into silicon causes radiation damage. If a sufficient dose is implanted, complete amorphisation can result in any implanted part of an optical device. Amorphous silicon has a refractive index that is significantly different higher than that of crystalline silicon (~10-1), and can therefore form the basis of a refractive index change in optical devices. This refractive index change can be partially or completely removed by annealing. In recent years we have presented results on the development of erasable gratings in silicon to facilitate wafer scale testing of silicon photonics circuits. These gratings are formed by amorphising selected areas of silicon by utilising ion implantation of Germanium. However, we have now used similar technology for trimming of integrated photonic components. In this paper we discuss design, modelling and fabrication of ring resonators and their subsequent trimming using ion implantation of Germanium into silicon followed by annealing.

Topics
  • impedance spectroscopy
  • amorphous
  • Silicon
  • annealing
  • Germanium