Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (3/3 displayed)

  • 2022Flight-like critical-angle transmission grating x-ray performance for Arcus4citations
  • 2018Blazed transmission grating technology development for the Arcus x-ray spectrometer explorer12citations
  • 2016New lithographic techniques for x-ray spectroscopy1citations

Places of action

Chart of shared publication
Langmeier, Andreas
1 / 1 shared
Günther, Hans Moritz
1 / 1 shared
Schmidt, Thomas
1 / 21 shared
Bruccoleri, Alexander R.
2 / 2 shared
Garner, Alan
1 / 1 shared
Cheimets, Peter
1 / 2 shared
Mueller, Thomas
1 / 5 shared
Burwitz, Vadim
2 / 7 shared
Schattenburg, Mark L.
2 / 2 shared
Gullikson, Eric M.
2 / 2 shared
Heilmann, Ralf K.
2 / 3 shared
Rukdee, Surangkhana
1 / 1 shared
Hertz, Edward
2 / 2 shared
Smith, Randall K.
2 / 2 shared
Hartner, Gisela
2 / 2 shared
Pelliciari, Carlo
1 / 1 shared
Marshall, Herman L.
1 / 4 shared
Lamarr, Beverly
1 / 1 shared
Heine, Sarah N. T.
1 / 1 shared
Guenther, Hans M.
1 / 1 shared
Schulz, Norbert S.
1 / 1 shared
Song, Jungki
1 / 1 shared
Cheimetz, Peter
1 / 1 shared
La Caria, Marlis-Madeleine
1 / 1 shared
Mccoy, Jake
1 / 3 shared
Chart of publication period
2022
2018
2016

Co-Authors (by relevance)

  • Langmeier, Andreas
  • Günther, Hans Moritz
  • Schmidt, Thomas
  • Bruccoleri, Alexander R.
  • Garner, Alan
  • Cheimets, Peter
  • Mueller, Thomas
  • Burwitz, Vadim
  • Schattenburg, Mark L.
  • Gullikson, Eric M.
  • Heilmann, Ralf K.
  • Rukdee, Surangkhana
  • Hertz, Edward
  • Smith, Randall K.
  • Hartner, Gisela
  • Pelliciari, Carlo
  • Marshall, Herman L.
  • Lamarr, Beverly
  • Heine, Sarah N. T.
  • Guenther, Hans M.
  • Schulz, Norbert S.
  • Song, Jungki
  • Cheimetz, Peter
  • La Caria, Marlis-Madeleine
  • Mccoy, Jake
OrganizationsLocationPeople

document

New lithographic techniques for x-ray spectroscopy

  • Mccoy, Jake
  • Deroo, Casey
Abstract

Off-plane reflection gratings require high-fidelity, custom groove profiles to perform with high spectral resolution in a Wolter-I optical system. This places a premium on exploring lithographic techniques in nanofabrication to produce state-of-the-art gratings. The fabrication recipe currently being pursued involves electron-beam lithography (EBL) and reactive ion etching (RIE) to define the groove profile, wet anisotropic etching in silicon to achieve blazed grooves and UV-nanoimprint lithography (UV-NIL) to replicate the final product. A process involving grayscale EBL and thermal reflow known as thermally activated selective topography equilibration (TASTE) is also being investigated as an alternative method to fabricate these gratings. However, a master grating fabricated entirely in soft polymeric resist through the TASTE process requires imprinting procedures other than UV-NIL to explored. A commerically available process called substrate conformal imprint lithography (SCIL) has been identified as a possible solution to this problem. SCIL also has the ability to replicate etched silicon gratings with reduced trapped air defects as compared to UV-NIL, where it is difficult to achieve conformal contact over large areas. As a result, SCIL has the potential to replace UV-NIL in the current grating fabrication recipe....

Topics
  • impedance spectroscopy
  • anisotropic
  • Silicon
  • defect
  • lithography
  • X-ray spectroscopy
  • plasma etching