Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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Patorski, Krzysztof

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (9/9 displayed)

  • 2016Surface flatness measurement of quasi-parallel plates employing three-beam interference with strong reference beamcitations
  • 2016Subtractive two-frame three-beam phase-stepping interferometry for testing surface shape of quasi-parallel plates 5citations
  • 2015Three-beam interferogram analysis method for surface flatness testing of glass plates and wedges2citations
  • 2014Evaluation of optical parameters of quasi-parallel plates with single-frame interferogram analysis methods and eliminating the influence of camera parasitic fringes4citations
  • 2014Optical metrology with Hilbert-Huang fringe pattern analysis for experimental mechanicscitations
  • 2013Highly contrasted Bessel fringe minima visualization for time-averaged vibration profilometry using Hilbert transform two-frame processing22citations
  • 2012Continuous wavelet transform for d-space distribution analysis in nanocrystallic materials2citations
  • 2008Quasi-parallel glass plate measurements using Fizeau interferometer1citations
  • 2007Derivation of quasi-parallel glass plate parameters tested in a Fizeau interferometer2citations

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Sunderland, Zofia
4 / 4 shared
Trusiak, Maciej
3 / 4 shared
Pokorski, Krzysztof
1 / 1 shared
Wielgus, Maciej
2 / 3 shared
Kamińska, Eliana
1 / 4 shared
Grochowski, Jakub
1 / 1 shared
Styk, Adam
2 / 2 shared
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Co-Authors (by relevance)

  • Sunderland, Zofia
  • Trusiak, Maciej
  • Pokorski, Krzysztof
  • Wielgus, Maciej
  • Kamińska, Eliana
  • Grochowski, Jakub
  • Styk, Adam
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document

Three-beam interferogram analysis method for surface flatness testing of glass plates and wedges

  • Sunderland, Zofia
  • Patorski, Krzysztof
Abstract

When testing transparent plates with high quality flat surfaces and a small angle between them the three-beam interference phenomenon is observed. Since the reference beam and the object beams reflected from both the front and back surface of a sample are detected, the recorded intensity distribution may be regarded as a sum of three fringe patterns. Images of that type cannot be succesfully analyzed with standard interferogram analysis methods. They contain, however, useful information on the tested plate surface flatness and its optical thickness variations. Several methods were elaborated to decode the plate parameters. Our technique represents a competitive solution which allows for retrieval of phase components of the three-beam interferogram. It requires recording two images: a three-beam interferogram and the two-beam one with the reference beam blocked. Mutually subtracting these images leads to the intensity distribution which, under some assumptions, provides access to the two component fringe sets which encode surfaces flatness. At various stages of processing we take advantage of nonlinear operations as well as single-frame interferogram analysis methods. Two-dimensional continuous wavelet transform (2D CWT) is used to separate a particular fringe family from the overall interferogram intensity distribution as well as to estimate the phase distribution from a pattern. We distinguish two processing paths depending on the relative density of fringe sets which is connected with geometry of a sample and optical setup. The proposed method is tested on simulated data.

Topics
  • density
  • impedance spectroscopy
  • surface
  • phase
  • glass
  • glass
  • two-dimensional