Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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National Institute of Telecommunications

in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (5/5 displayed)

  • 2022Performance of nanoimprinted and nanocoated optical label-free biosensor - nanocoating properties perspective6citations
  • 2018Optical monitoring of electrochemical processes with ITO-based lossy-mode resonance optical fiber sensor applied as an electrode56citations
  • 2018Optical detection of ketoprofen by its electropolymerization on an indium tin oxide-coated optical fiber probe29citations
  • 2015Sensing properties of periodic stack of nano-films deposited with various vapor-based techniques on optical fiber end-face3citations
  • 2011Analysis of microstructure eutectic Tb3Sc2Al3O12-TbScO3 photonic propertiescitations

Places of action

Chart of shared publication
Kwietniewski, Norbert
1 / 15 shared
Smietana, Mateusz
2 / 2 shared
Dziekan, Zofia
1 / 1 shared
Parzuchowski, Pawel
1 / 1 shared
Pituła, Emil
1 / 1 shared
Janik, Monika
1 / 1 shared
Śmiarowski, Tomasz
1 / 1 shared
Niedziółka-Jönsson, J.
1 / 1 shared
Stonio, Bartlomiej
1 / 3 shared
Bogdanowicz, Robert
2 / 8 shared
Ossowski, Tadeusz
2 / 9 shared
Białobrzeska, Wioleta
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Niedziałkowski, Paweł
2 / 7 shared
Sobaszek, Michal
1 / 1 shared
Michalak, Bartosz
1 / 1 shared
Stranak, Vitezslav
2 / 3 shared
Karczewski, Jakub
1 / 13 shared
Sezemsky, Petr
2 / 2 shared
Śmietana, Mateusz
1 / 1 shared
Burnat, Dariusz
1 / 8 shared
Sobaszek, Michał
1 / 1 shared
Cebula, Zofia
1 / 1 shared
Różycki-Bakon, Radosław
1 / 1 shared
Śmietana, Mateusz Jakub
1 / 3 shared
Firek, Piotr
1 / 19 shared
Turczyński, Sebastian
1 / 2 shared
Mossakowska-Wyszyńska, Agnieszka
1 / 2 shared
Kaczkan, Marcin
1 / 3 shared
Kołodziejak, Katarzyna
1 / 4 shared
Pawlak, Dorota A.
1 / 8 shared
Chart of publication period
2022
2018
2015
2011

Co-Authors (by relevance)

  • Kwietniewski, Norbert
  • Smietana, Mateusz
  • Dziekan, Zofia
  • Parzuchowski, Pawel
  • Pituła, Emil
  • Janik, Monika
  • Śmiarowski, Tomasz
  • Niedziółka-Jönsson, J.
  • Stonio, Bartlomiej
  • Bogdanowicz, Robert
  • Ossowski, Tadeusz
  • Białobrzeska, Wioleta
  • Niedziałkowski, Paweł
  • Sobaszek, Michal
  • Michalak, Bartosz
  • Stranak, Vitezslav
  • Karczewski, Jakub
  • Sezemsky, Petr
  • Śmietana, Mateusz
  • Burnat, Dariusz
  • Sobaszek, Michał
  • Cebula, Zofia
  • Różycki-Bakon, Radosław
  • Śmietana, Mateusz Jakub
  • Firek, Piotr
  • Turczyński, Sebastian
  • Mossakowska-Wyszyńska, Agnieszka
  • Kaczkan, Marcin
  • Kołodziejak, Katarzyna
  • Pawlak, Dorota A.
OrganizationsLocationPeople

booksection

Sensing properties of periodic stack of nano-films deposited with various vapor-based techniques on optical fiber end-face

  • Różycki-Bakon, Radosław
  • Śmietana, Mateusz Jakub
  • Firek, Piotr
  • Koba, Marcin
Abstract

This work presents a study on sensing capabilities of stacks of nano-films deposited on a single-mode optical fiber end-faces. The stacks consist of periodically interchanging thin-film layers of materials characterized by different refractive indices (RI). The number of layers is relatively small to encourage light-analyte interactions. Two different deposition techniques are considered, i.e., radio frequency plasma enhanced chemical vapor deposition (RF PECVD) and physical vapor deposition by reactive magnetron sputtering (RMS). The former technique allows to deposit stacks consisting of silicon nitride nano-films, and the latter is well suited for aluminum and titanium oxides alternating layers. The structures are tested for external RI and temperature measurements. © (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.

Topics
  • impedance spectroscopy
  • aluminium
  • reactive
  • physical vapor deposition
  • nitride
  • Silicon
  • titanium
  • chemical vapor deposition