Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (3/3 displayed)

  • 2023Titanium dioxide nanoparticles affect osteoblast-derived exosome cargos and impair osteogenic differentiation of human mesenchymal stem cells15citations
  • 2022Preliminary tribo-electrochemical and biological responses of the Ti-TiB-TiCx in-situ composites intended for load-bearing biomedical implants18citations
  • 2015Focused Ion beam 3D nano-patterned optical fiber tips for advanced beam profile engineering3citations

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Piperni, Sg
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De Souza, W.
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Melo, Sa
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Granjeiro, Jm
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Rocha, La
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Fernandes, Mh
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Simoes, S.
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Alves, Ac
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Rossi, Al
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Gemini Piperni, S.
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Costa, Na
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Toptan, F.
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Jorge, Pedro
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Flores, R.
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Co-Authors (by relevance)

  • Piperni, Sg
  • De Souza, W.
  • Melo, Sa
  • Granjeiro, Jm
  • Rocha, La
  • Fernandes, Mh
  • Simoes, S.
  • Alves, Ac
  • Rossi, Al
  • Gemini Piperni, S.
  • Sousa, L.
  • Costa, Na
  • Toptan, F.
  • Jorge, Pedro
  • Viegas, J.
  • Flores, R.
  • Janeiro, R.
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document

Focused Ion beam 3D nano-patterned optical fiber tips for advanced beam profile engineering

  • Jorge, Pedro
  • Viegas, J.
  • Flores, R.
  • Ribeiro, Ar
  • Janeiro, R.
Abstract

Focused ion beam (FIB) patterning of 3D topography on optical fiber tips for application in stand-alone, rugged and simplified setups for optical tweezers cell sorters, optical near-field lithography and optical beam profile engineering are reported. We demonstrate various configurations based on single-step FIB patterning, multiple-step FIB processing and hybrid approaches based on optical fiber pre- and post-FIB treatment with either etching, fusion splicing, photo-polymerization or electroplating steps for optical fiber texture, topography and composition engineering. Different conductive coatings for minimal charge accumulation and beam drift are studied with the relative merits compared. Furthermore optimal beam parameters for accurate pattern replication and positioning are also presented. Measured experimental field profiles are compared with numerical simulations of fabricated optical fiber tips for fabrication accuracy evaluation. Applications employing these engineered fiber tips in the field of optical tweezers, optical vortex generation, photolithography, photo-polymerization and beam forming are presented.

Topics
  • simulation
  • focused ion beam
  • texture
  • etching
  • forming
  • lithography