Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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Szczygiel, Robert

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AGH University of Krakow

in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (3/3 displayed)

  • 2022Pixel readout IC for CdTe detectors operating in single photon counting mode with interpixel communication5citations
  • 2021X-ray imaging of moving objects using on-chip TDI and MDX methods with single photon counting CdTe hybrid pixel detector2citations
  • 2014Interface and Protocol Development for STS Read-out ASIC in the CBM Experiment at FAIR8citations

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Zabołotny, Wojciech
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Kasiński, Krzysztof
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2022
2021
2014

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  • Zabołotny, Wojciech
  • Kasiński, Krzysztof
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document

Interface and Protocol Development for STS Read-out ASIC in the CBM Experiment at FAIR

  • Zabołotny, Wojciech
  • Kasiński, Krzysztof
  • Szczygiel, Robert
Abstract

This paper presents a proposal of a protocol for communication between the read-out integrated circuit for the STS(Silicon Tracking System) and the Data Processing Board (DPB) at CBM (Compressed Baryonic Matter) experiment atFAIR, GSI (Helmholtzzentrum fuer Schwerionenforschung GmbH) in Germany. The application background, objectivesand proposed solution is presented.

Topics
  • impedance spectroscopy
  • experiment
  • Silicon
  • scanning tunnelling spectroscopy