Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 2016Performance and prospects of far ultraviolet aluminum mirrors protected by atomic layer deposition51citations

Places of action

Chart of shared publication
France, Kevin
1 / 6 shared
Nikzad, Shouleh
1 / 7 shared
Jewell, April D.
1 / 6 shared
Hennessy, John
1 / 6 shared
Moore, Christopher S.
1 / 5 shared
Balasubramanian, Kunjithapatham
1 / 4 shared
Chart of publication period
2016

Co-Authors (by relevance)

  • France, Kevin
  • Nikzad, Shouleh
  • Jewell, April D.
  • Hennessy, John
  • Moore, Christopher S.
  • Balasubramanian, Kunjithapatham
OrganizationsLocationPeople

article

Performance and prospects of far ultraviolet aluminum mirrors protected by atomic layer deposition

  • France, Kevin
  • Nikzad, Shouleh
  • Jewell, April D.
  • Hennessy, John
  • Moore, Christopher S.
  • Balasubramanian, Kunjithapatham
  • Quijada, Manuel
Abstract

Metallic aluminum mirrors remain the best choice for high reflectance applications at ultraviolet wavelengths (90 to 320 nm) and maintain good performance through optical and infrared wavelengths. Transparent protective coatings are required to prevent the formation of an oxide layer, which severely degrades reflectance at wavelengths below 250 nm. We report on the development of atomic layer deposition (ALD) processes for thin protective films of aluminum fluoride that are viable for application at substrate temperatures &lt;200°C. Reflectance measurements of aluminum films evaporated in ultrahigh vacuum conditions, and protected mirrors encapsulated with ALD AlF<SUB>3</SUB> are used to evaluate the far ultraviolet (90 to 190 nm) and near ultraviolet (190 to 320 nm) performance of both the ALD material and the underlying metal. Optical modeling is used to predict the performance of optimized structures for future astronomical mirror applications....

Topics
  • impedance spectroscopy
  • aluminium
  • atomic layer deposition