| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Lupi, Stefano
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (11/11 displayed)
- 2024Light-driven Electrodynamics and Demagnetization in Fe$_n$GeTe$_2$ (n = 3, 5) Thin Films
- 2023Tunable Chemical Reactivity and Selectivity of WO3/TiO2 Heterojunction for Gas Sensing Applicationscitations
- 2022Oxygen-Driven Metal–Insulator Transition in SrNbO 3 Thin Films Probed by Infrared Spectroscopycitations
- 2022Tunable Chemical Reactivity and Selectivity of WO3/TiO2 Heterojunction for Gas Sensing Applicationscitations
- 2022Oxygen-Driven Metal–Insulator Transition in SrNbO3 Thin Films Probed by Infrared Spectroscopycitations
- 2020Wetting Properties of Graphene Aerogelscitations
- 2020Tuning optical absorption of anatase thin lms across the visible/near-infrared spectral regioncitations
- 2019MoO3 films grown on polycrystalline Cu: Morphological, structural, and electronic propertiescitations
- 2018Mid-Infrared Plasmonic Excitation in Indium Tin Oxide Microhole Arrayscitations
- 2016Interband characterization and electronic transport control of nanoscaled GeTe/Sb2Te3 superlatticescitations
- 2013Differential Fano interference spectroscopy of subwavelength hole arrays for mid-infrared mass sensors
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article
MoO3 films grown on polycrystalline Cu: Morphological, structural, and electronic properties
Abstract
<jats:p>In this work, the authors investigated MoO3 films with thickness between 30 nm and 1 μm grown at room temperature by solid phase deposition on polycrystalline Cu substrates. Atomic force microscopy, scanning electron microscopy, and scanning tunneling microscopy revealed the presence of a homogenous MoO3 film with a “grainlike” morphology, while Raman spectroscopy showed an amorphous character of the film. Nanoindentation measurements evidenced a coating hardness and stiffness comparable with the copper substrate ones, while Auger electron spectroscopy, x-ray absorption spectroscopy, and secondary electron spectroscopy displayed a pure MoO3 stoichiometry and a work function ΦMoO3 = 6.5 eV, 1.8 eV higher than that of the Cu substrate. MoO3 films of thickness between 30 and 300 nm evidenced a metallic behavior, whereas for higher thickness, the resistance–temperature curves showed a semiconducting character.</jats:p>