Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 2017Review Article: Overview of lanthanide pnictide films and nanoparticles epitaxially incorporated into III-V semiconductors25citations

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Chart of shared publication
Lewis, Matthew R.
1 / 1 shared
Bomberger, Cory C.
1 / 1 shared
Zide, Joshua M. O.
1 / 2 shared
Chart of publication period
2017

Co-Authors (by relevance)

  • Lewis, Matthew R.
  • Bomberger, Cory C.
  • Zide, Joshua M. O.
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article

Review Article: Overview of lanthanide pnictide films and nanoparticles epitaxially incorporated into III-V semiconductors

  • Lewis, Matthew R.
  • Vanderhoef, Laura R.
  • Bomberger, Cory C.
  • Zide, Joshua M. O.
Abstract

<jats:p>The incorporation of lanthanide pnictide nanoparticles and films into III-V matrices allows for semiconductor composites with a wide range of potential optical, electrical, and thermal properties, making them useful for applications in thermoelectrics, tunnel junctions, phototconductive switches, and as contact layers. The similarities in crystal structures and lattice constants allow them to be epitaxially incorporated into III-V semiconductors with low defect densities and high overall film quality. A variety of growth techniques for these composites with be discussed, along with their growth mechanisms and current applications, with a focus on more recent developments. Results obtained from molecular beam epitaxy film growth will be highlighted, although other growth techniques will be mentioned. Optical and electronic characterization along with the microscopy analysis of these composites is presented to demonstrate influence of nanoinclusion composition and morphology on the resulting properties of the composite material.</jats:p>

Topics
  • nanoparticle
  • impedance spectroscopy
  • composite
  • defect
  • Lanthanide
  • microscopy
  • III-V semiconductor