Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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Technical University of Denmark

in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (4/4 displayed)

  • 2016Fabrication of high aspect ratio TiO2 and Al2O3 nanogratings by atomic layer deposition45citations
  • 2016Fabrication of high aspect ratio TiO 2 and Al 2 O 3 nanogratings by atomic layer deposition45citations
  • 2015Injection molded polymeric hard X-ray lenses4citations
  • 2014Etching patterns on the micro‐ and nanoscalecitations

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Mar, Mikkel Dysseholm
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Jensen, Flemming
4 / 32 shared
Shkondin, Evgeniy
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Takayama, Osamu
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Larsen, Pernille Voss
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Lavrinenko, Andrei V.
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Lavrinenko, Andrei
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Jakobsen, Anders Clemen
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Stöhr, Frederik
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Hansen, Ole
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Hübner, Jörg
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Herstrøm, Berit
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2015
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Co-Authors (by relevance)

  • Mar, Mikkel Dysseholm
  • Jensen, Flemming
  • Shkondin, Evgeniy
  • Takayama, Osamu
  • Larsen, Pernille Voss
  • Lavrinenko, Andrei V.
  • Lavrinenko, Andrei
  • Jakobsen, Anders Clemen
  • Stöhr, Frederik
  • Simons, Hugh
  • Hansen, Ole
  • Nielsen, Claus Højgård
  • Poulsen, Henning, F.
  • Hübner, Jörg
  • Herstrøm, Berit
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article

Fabrication of high aspect ratio TiO2 and Al2O3 nanogratings by atomic layer deposition

  • Mar, Mikkel Dysseholm
  • Jensen, Flemming
  • Michael-Lindhard, Jonas
  • Shkondin, Evgeniy
  • Takayama, Osamu
  • Larsen, Pernille Voss
  • Lavrinenko, Andrei V.
Abstract

The authors report on the fabrication of TiO<sub>2</sub> and Al<sub>2</sub>O<sub>3</sub> nanostructured gratings with an aspect ratio of up to 50. The gratings were made by a combination of atomic layer deposition (ALD) and dry etch techniques. The workflow included fabrication of a Si template using deep reactive ion etching followed by ALD of TiO<sub>2</sub> or Al<sub>2</sub>O<sub>3</sub>. Then, the template was etched away using SF<sub>6</sub> in an <br/>inductively coupled plasma tool, which resulted in the formation of isolated ALD coatings, thereby achieving high aspect ratio grating structures. SF<sub>6</sub> plasma removes silicon selectively without any observable influence on TiO<sub>2</sub> or Al<sub>2</sub>O<sub>3</sub>, thus revealing high selectivity throughout the fabrication. Scanning electron microscopy was used to analyze every fabrication step. Due to nonreleased stress in the ALD coatings, the top parts of the gratings were observed to bend inward as the Sitemplate was removed, thus resulting in a gradual change in the pitch value of the structures. The pitch on top of the gratings is 400 nm, and it gradually reduces to 200 nm at the bottom. The form of the bending can be reshaped by Arþ ion beam etching. The chemical purity of the ALD grown materials was analyzed by x-ray photoelectron spectroscopy. The approach presented opens the possibility to fabricate high quality optical metamaterials and functional nanostructures.

Topics
  • impedance spectroscopy
  • scanning electron microscopy
  • x-ray photoelectron spectroscopy
  • Silicon
  • metamaterial
  • atomic layer deposition
  • plasma etching